Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2402
Full metadata record
DC FieldValueLanguage
dc.contributor.authorProost, J-
dc.contributor.authorD'HAEN, Jan-
dc.contributor.authorJin, M-
dc.contributor.authorVerlinden, B-
dc.date.accessioned2007-11-13T22:46:48Z-
dc.date.available2007-11-13T22:46:48Z-
dc.date.issued2004-
dc.identifier.citationSCRIPTA MATERIALIA, 50(2). p. 267-271-
dc.identifier.issn1359-6462-
dc.identifier.urihttp://hdl.handle.net/1942/2402-
dc.description.abstractElectromigration drift studies have been performed inside a SEM. Based on the observed drift mode, a grain boundary grooving model is proposed to account for the atomistic details of current-induced motion. The role of grain boundary structure in determining the local direction of groove propagation is illustrated. (C) 2003 Published by Elsevier Ltd. on behalf of Acta Materialia Inc.-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subject.otherelectromigration; thin films; kinetics; grain boundary structure-
dc.titleOn the atomistic details of electromigration-induced drift-
dc.typeJournal Contribution-
dc.identifier.epage271-
dc.identifier.issue2-
dc.identifier.spage267-
dc.identifier.volume50-
local.format.pages5-
local.bibliographicCitation.jcatA1-
dc.description.notesDept Met & Mat Engn, B-3001 Louvain, Belgium. IMOMEC, B-3590 Diepenbeek, Belgium.Proost, J, Dept Met & Mat Engn, Kasteelpk Arenberg 44, B-3001 Louvain, Belgium.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/j.scriptamat.2003.10.005-
dc.identifier.isi000186377200016-
item.fullcitationProost, J; D'HAEN, Jan; Jin, M & Verlinden, B (2004) On the atomistic details of electromigration-induced drift. In: SCRIPTA MATERIALIA, 50(2). p. 267-271.-
item.fulltextNo Fulltext-
item.validationecoom 2004-
item.accessRightsClosed Access-
item.contributorProost, J-
item.contributorD'HAEN, Jan-
item.contributorJin, M-
item.contributorVerlinden, B-
crisitem.journal.issn1359-6462-
crisitem.journal.eissn1872-8456-
Appears in Collections:Research publications
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.