Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/24419
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dc.contributor.authorLEMMENS, Marijn-
dc.contributor.authorHyunsoo, Ha-
dc.contributor.authorVan Helleputte, Nick-
dc.contributor.authorBiesmans, Hanne-
dc.contributor.authorDe Raedt, Walter-
dc.contributor.authorGRIETEN, Lars-
dc.contributor.authorTHOELEN, Ronald-
dc.date.accessioned2017-09-08T07:37:41Z-
dc.date.available2017-09-08T07:37:41Z-
dc.date.issued2017-
dc.identifier.citationEngineering of Functional Interfaces (EnFI 2017), Philipps-Universität Marburg, Germany, 28-29/08/2017-
dc.identifier.urihttp://hdl.handle.net/1942/24419-
dc.language.isoen-
dc.titleElectrical impedance tomography with a lab-on-chip for imaging cells in culture-
dc.typeConference Material-
local.bibliographicCitation.conferencedate2017, August 28-29-
local.bibliographicCitation.conferencenameEngineering of Functional Interfaces (EnFI 2017)-
local.bibliographicCitation.conferenceplacePhilipps-Universität Marburg, Germany-
local.bibliographicCitation.jcatC2-
local.type.refereedNon-Refereed-
local.type.specifiedConference Presentation-
item.fullcitationLEMMENS, Marijn; Hyunsoo, Ha; Van Helleputte, Nick; Biesmans, Hanne; De Raedt, Walter; GRIETEN, Lars & THOELEN, Ronald (2017) Electrical impedance tomography with a lab-on-chip for imaging cells in culture. In: Engineering of Functional Interfaces (EnFI 2017), Philipps-Universität Marburg, Germany, 28-29/08/2017.-
item.contributorLEMMENS, Marijn-
item.contributorHyunsoo, Ha-
item.contributorVan Helleputte, Nick-
item.contributorBiesmans, Hanne-
item.contributorDe Raedt, Walter-
item.contributorGRIETEN, Lars-
item.contributorTHOELEN, Ronald-
item.accessRightsRestricted Access-
item.fulltextWith Fulltext-
Appears in Collections:Research publications
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