Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2536
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dc.contributor.authorTielemans, L-
dc.contributor.authorRongen, R-
dc.contributor.authorDE CEUNINCK, Ward-
dc.date.accessioned2007-11-15T09:30:29Z-
dc.date.available2007-11-15T09:30:29Z-
dc.date.issued2002-
dc.identifier.citationMICROELECTRONICS RELIABILITY, 42(9-11). p. 1339-1345-
dc.identifier.issn0026-2714-
dc.identifier.urihttp://hdl.handle.net/1942/2536-
dc.description.abstractReliability tests are performed for 2 reasons: i. to predict lifetime and ii. to monitor the wafer processes for reliability behaviour. In the prediction of life time large prediction levels can be observed. This large uncertainty is due to different types of errors made during the reliability test and data analysis. All lyrics of errors using the "time to failure" test approach will be discussed and methods are proposed to improve how reliability tests can be improved. (C) 2002 Elsevier Science Ltd. All rights reserved.-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.titleHow reliable are reliability tests?-
dc.typeJournal Contribution-
dc.identifier.epage1345-
dc.identifier.issue9-11-
dc.identifier.spage1339-
dc.identifier.volume42-
local.format.pages7-
local.bibliographicCitation.jcatA1-
dc.description.notesChiron Pte Ltd, Singapore 757720, Singapore. ESE bvba, B-2260 Westerlo, Belgium. Philips, NL-6534 AE Nijmegen, Netherlands. LUC IMO, B-3590 Diepenbeek, Belgium.Tielemans, L, Chiron Pte Ltd, 21 Woodlands Ind Pk E1 02-06, Singapore 757720, Singapore.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0026-2714(02)00146-4-
dc.identifier.isi000178889900017-
item.accessRightsClosed Access-
item.validationecoom 2003-
item.fulltextNo Fulltext-
item.fullcitationTielemans, L; Rongen, R & DE CEUNINCK, Ward (2002) How reliable are reliability tests?. In: MICROELECTRONICS RELIABILITY, 42(9-11). p. 1339-1345.-
item.contributorTielemans, L-
item.contributorRongen, R-
item.contributorDE CEUNINCK, Ward-
crisitem.journal.issn0026-2714-
crisitem.journal.eissn1872-941X-
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