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Title: | Nanoscale investigation of enhanced electron field emission for silver ion implanted/post-annealed ultrananocrystalline diamond films | Authors: | Panda, Kalpataru Hyeok, Jeong Jin Park, Jeong Young KAMATCHI JOTHIRAMALINGAM, Sankaran Balakrishnan, Sundaravel Lin, I. -Nan |
Issue Date: | 2017 | Publisher: | NATURE PUBLISHING GROUP | Source: | SCIENTIFIC REPORTS, 7 (Art N° 16325) | Abstract: | Silver (Ag) ions are implanted in ultrananocrystalline diamond (UNCD) films to enhance the electron field emission (EFE) properties, resulting in low turn-on field of 8.5 V/mu m with high EFE current density of 6.2 mA/cm(2) (at an applied field of 20.5 V/mu m). Detailed nanoscale investigation by atomic force microscopy based peak force-controlled tunneling atomic force microscopy (PF-TUNA) and ultra-high vacuum scanning tunneling microscopy (STM) based current imaging tunneling spectroscopy (CITS) reveal that the UNCD grain boundaries are the preferred electron emission sites. The two scanning probe microscopic results supplement each other well. However, the PF-TUNA measurement is found to be better for explaining the local electron emission behavior than the STM-based CITS technique. The formation of Ag nanoparticles induced abundant sp(2) nanographitic phases along the grain boundaries facilitate the easy transport of electrons and is believed to be a prime factor in enhancing the conductivity/EFE properties of UNCD films. The nanoscale understanding on the origin of electron emission sites in Ag-ion implanted/annealed UNCD films using the scanning probe microscopic techniques will certainly help in developing high-brightness electron sources for flat-panel displays applications. | Notes: | [Panda, Kalpataru; Park, Jeong Young] Inst for Basic Sci Korea, Ctr Nanomat & Chem React, Daejeon 34141, South Korea. [Hyeok, Jeong Jin; Park, Jeong Young] Korea Adv Inst Sci & Technol, Grad Sch EEWS, Daejeon 34141, South Korea. [Sankaran, Kamatchi Jothiramalingam] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Sankaran, Kamatchi Jothiramalingam] IMEC VZW, IMOMEC, Diepenbeek, Belgium. [Balakrishnan, Sundaravel] Indira Gandhi Ctr Atom Res, Mat Phys Div, Kalpakkam 603102, Tamil Nadu, India. [Lin, I. -Nan] Tamkang Univ, Dept Phys, Tamsui 251, Taiwan. | Document URI: | http://hdl.handle.net/1942/26296 | ISSN: | 2045-2322 | e-ISSN: | 2045-2322 | DOI: | 10.1038/s41598-017-16395-1 | ISI #: | 000416137700013 | Rights: | Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. © Te Author(s) 2017 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2018 |
Appears in Collections: | Research publications |
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