Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/26547
Full metadata record
DC FieldValueLanguage
dc.contributor.authorNEUPANE, Shova-
dc.contributor.authorLOSADA-PEREZ, Patricia-
dc.contributor.authorVIVEGNIS, Sebastien-
dc.contributor.authorMekhalif, Zineb-
dc.contributor.authorDelhalle, Joseph-
dc.contributor.authorBashir, Asif-
dc.contributor.authorRENNER, Frank-
dc.date.accessioned2018-08-02T11:59:04Z-
dc.date.available2018-08-02T11:59:04Z-
dc.date.issued2018-
dc.identifier.citationLANGMUIR, 34(1), p. 66-72-
dc.identifier.issn0743-7463-
dc.identifier.urihttp://hdl.handle.net/1942/26547-
dc.description.abstractControlling the molecular organization of organic self-assembled monolayers (SAM) is of utmost importance in nanotechnology, molecular electronics, and surface science. Here we propose two well-differentiated approaches, double printing based on micro-contact printing (mu-cp) and molecular backfilling adsorption, to produce complex alkanethiol films. The resulting films on model Au surfaces were characterized by atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and contact angle measurements. Double printing alkanethiols results in clear coexisting regions where no molecular displacement is observed, highlighting the slow diffusion rates of long alkanethiols and large attractive interaction between long alkyl chains. Exposing a single-print mu-cp Au substrate to an additional alkanethiol solution yields the formation of differently ordered domain boundaries with different thickness and micrometer lateral size. The high order is a result of enhanced molecular mobility and restructuring during solution backfilling. The formed molecular assemblies constitute an excellent testing ground for nanoscale phenomena that strongly depend on the nanoscale geometrical and chemical features of the surface such as designed functionality or corrosion initiation and inhibition.-
dc.description.sponsorshipFinancial support by FWO Odysseus program under G0D0115N project is greatly appreciated. We are very grateful to Prof. Andreas Terfort for kindly providing the PDMS stamps.-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.rights© 2017 American Chemical Society-
dc.titleTwo-Step Nanoscale Approach for Well-Defined Complex Alkanethiol Films on Au Surfaces-
dc.typeJournal Contribution-
dc.identifier.epage72-
dc.identifier.issue1-
dc.identifier.spage66-
dc.identifier.volume34-
local.format.pages7-
local.bibliographicCitation.jcatA1-
dc.description.notes[Neupane, S.; Losada-Perez, P.; Vivegnis, S.; Renner, F. U.] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Neupane, S.; Losada-Perez, P.; Renner, F. U.] IMEC Vzw, Div IMOMEC, B-3590 Diepenbeek, Belgium. [Vivegnis, S.; Mekhalif, Z.; Delhalle, J.] Univ Namur, Lab Chem & Electrochem Surfaces CES, 61 Rue Bruxelles, B-5000 Namur, Belgium. [Bashir, A.] Thyssenkrupp Bilstein GmbH, Niederkell 25, D-54429 Mandern, Germany. [Losada-Perez, P.] ULB, Soft Matter Phys Lab, Campus La Plaine,CP223,Blvd Triomphe, B-1050 Brussels, Belgium.-
local.publisher.placeWASHINGTON-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1021/acs.langmuir.7b02760-
dc.identifier.isi000422611500009-
item.accessRightsOpen Access-
item.validationecoom 2019-
item.fulltextWith Fulltext-
item.contributorNEUPANE, Shova-
item.contributorLOSADA-PEREZ, Patricia-
item.contributorVIVEGNIS, Sebastien-
item.contributorMekhalif, Zineb-
item.contributorDelhalle, Joseph-
item.contributorBashir, Asif-
item.contributorRENNER, Frank-
item.fullcitationNEUPANE, Shova; LOSADA-PEREZ, Patricia; VIVEGNIS, Sebastien; Mekhalif, Zineb; Delhalle, Joseph; Bashir, Asif & RENNER, Frank (2018) Two-Step Nanoscale Approach for Well-Defined Complex Alkanethiol Films on Au Surfaces. In: LANGMUIR, 34(1), p. 66-72.-
crisitem.journal.issn0743-7463-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
acs.langmuir.7b02760.pdf
  Restricted Access
Published version6.03 MBAdobe PDFView/Open    Request a copy
neupane et al 2018 authors version.pdfPeer-reviewed author version1.59 MBAdobe PDFView/Open
Show simple item record

SCOPUSTM   
Citations

1
checked on Sep 3, 2020

WEB OF SCIENCETM
Citations

7
checked on Apr 24, 2024

Page view(s)

70
checked on Sep 5, 2022

Download(s)

220
checked on Sep 5, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.