Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/2691Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | HOOYBERGHS, Jef | - |
| dc.contributor.author | VANDERZANDE, Carlo | - |
| dc.date.accessioned | 2007-11-15T18:10:22Z | - |
| dc.date.available | 2007-11-15T18:10:22Z | - |
| dc.date.issued | 2001 | - |
| dc.identifier.citation | PHYSICAL REVIEW E, 6304(4) | - |
| dc.identifier.issn | 1063-651X | - |
| dc.identifier.uri | http://hdl.handle.net/1942/2691 | - |
| dc.description.abstract | We study the one-dimensional contact process in its quantum version using a recently proposed real-space renormalization technique for stochastic many-particle systems. Exploiting the duality and other properties of the model, we can apply the method for cells with up to 37 sites. After suitable extrapolation, we obtain exponent estimates that are comparable in accuracy with the best known in the literature. | - |
| dc.language.iso | en | - |
| dc.publisher | AMERICAN PHYSICAL SOC | - |
| dc.title | One-dimensional contact process: Duality and renormalization | - |
| dc.type | Journal Contribution | - |
| dc.identifier.issue | 4 | - |
| dc.identifier.volume | 6304 | - |
| local.format.pages | 8 | - |
| local.bibliographicCitation.jcat | A1 | - |
| dc.description.notes | Limburgs Univ Ctr, Dept WNI, B-3590 Diepenbeek, Belgium. | - |
| local.type.refereed | Refereed | - |
| local.type.specified | Article | - |
| dc.bibliographicCitation.oldjcat | A1 | - |
| dc.identifier.doi | 10.1103/PhysRevE.63.041109 | - |
| dc.identifier.isi | 000168214900011 | - |
| item.fulltext | No Fulltext | - |
| item.validation | ecoom 2002 | - |
| item.contributor | HOOYBERGHS, Jef | - |
| item.contributor | VANDERZANDE, Carlo | - |
| item.accessRights | Closed Access | - |
| item.fullcitation | HOOYBERGHS, Jef & VANDERZANDE, Carlo (2001) One-dimensional contact process: Duality and renormalization. In: PHYSICAL REVIEW E, 6304(4). | - |
| crisitem.journal.issn | 1063-651X | - |
| Appears in Collections: | Research publications | |
SCOPUSTM
Citations
20
checked on Dec 5, 2025
WEB OF SCIENCETM
Citations
17
checked on Dec 12, 2025
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.