Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2727
Title: An extended enterprise planning methodology for the discrete manufacturing industry
Authors: Frederix, F
Issue Date: 2001
Publisher: ELSEVIER SCIENCE BV
Source: EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 129(2). p. 317-325
Abstract: Extended factories consisting of geographically dispersed independent production facilities are already a reality in the global economy. Production facilities concentrate on core technologies and create partner networks for the manufacturing of their products, a trend initially visible in semiconductor manufacturing but quickly spreading to other industries. A methodology, more flexible and efficient than the traditional time-bucket-based techniques and dynamic dispatching heuristics, to plan the Extended Semiconductor Enterprise and schedule work at the different production entities is presented in this paper. The generic approach also opens opportunities for applications in other discrete manufacturing industries. The methodology uses stepwise search procedures to improve plans and make-or-buy decision processes to solve resource constraints. Focus of the paper is principally on resource scheduling and less on logistics and distribution topics. (C) 2001 Elsevier Science B.V. All rights reserved.
Notes: Alcatel Microelect, B-1930 Zaventem, Belgium. Limburgs Univ Ctr, B-3590 Diepenbeek, Belgium.Frederix, F, Alcatel Microelect, Excelsiorlaan 44, B-1930 Zaventem, Belgium.
Keywords: supply chain management; scheduling; simulated annealing; manufacturing; heuristics
Document URI: http://hdl.handle.net/1942/2727
ISSN: 0377-2217
e-ISSN: 1872-6860
DOI: 10.1016/S0377-2217(00)00229-0
ISI #: 000166103300011
Category: A1
Type: Journal Contribution
Validations: ecoom 2002
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

25
checked on Sep 2, 2020

WEB OF SCIENCETM
Citations

18
checked on Nov 26, 2022

Page view(s)

156
checked on Sep 7, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.