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http://hdl.handle.net/1942/2857
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DC Field | Value | Language |
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dc.contributor.author | D'HAEN, Jan | - |
dc.contributor.author | VAN OLMEN, Jan | - |
dc.contributor.author | BEELEN, Zjef | - |
dc.contributor.author | MANCA, Jean | - |
dc.contributor.author | MARTENS, Tom | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | Cannaerts, M | - |
dc.contributor.author | Maex, K | - |
dc.date.accessioned | 2007-11-20T10:17:35Z | - |
dc.date.available | 2007-11-20T10:17:35Z | - |
dc.date.issued | 2000 | - |
dc.identifier.citation | MICROELECTRONICS RELIABILITY, 40(8-10). p. 1407-1412 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://hdl.handle.net/1942/2857 | - |
dc.description.abstract | With so-called in-situ SEM experiments, electromigration experiments are performed in a SEM (scanning electron microscope) equipped with a heating stage. BSE (back scattered electron) images are taken continuously over the entire length of a metal line submitted to high current and temperature stress, monitoring in detail the microstructure. Comparing the electrical resistance curves with the corresponding SEM micrographs and with ex-situ AFM measurements leads to detailed qualitative and quantitative information about the occurring electromigration and precipitation / dissolution effects in the metal lines. (C) 2000 Elsevier Science Ltd. All rights reserved. | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.title | In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 1412 | - |
dc.identifier.issue | 8-10 | - |
dc.identifier.spage | 1407 | - |
dc.identifier.volume | 40 | - |
local.format.pages | 6 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Limburgs Univ Ctr, Inst Mat Res, B-3590 Diepenbeek, Belgium. Katholieke Univ Leuven, B-3001 Heverlee, Belgium. IMEC, B-3001 Heverlee, Belgium.d'Haen, J, Limburgs Univ Ctr, Inst Mat Res, Wetenschapspk, B-3590 Diepenbeek, Belgium. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1016/S0026-2714(00)00170-0 | - |
dc.identifier.isi | 000089532800028 | - |
item.fullcitation | D'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M & Maex, K (2000) In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions. In: MICROELECTRONICS RELIABILITY, 40(8-10). p. 1407-1412. | - |
item.accessRights | Closed Access | - |
item.contributor | D'HAEN, Jan | - |
item.contributor | VAN OLMEN, Jan | - |
item.contributor | BEELEN, Zjef | - |
item.contributor | MANCA, Jean | - |
item.contributor | MARTENS, Tom | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | Cannaerts, M | - |
item.contributor | Maex, K | - |
item.fulltext | No Fulltext | - |
item.validation | ecoom 2001 | - |
Appears in Collections: | Research publications |
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