Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/29010
Title: | Microwave cavity perturbation of nitrogen doped nano-crystalline diamond films | Authors: | Cuenca, Jerome A. KAMATCHI JOTHIRAMALINGAM, Sankaran POBEDINSKAS, Paulius Panda, Kalpataru Lin, I-Nan Porch, Adrian HAENEN, Ken Williams, Oliver A. |
Issue Date: | 2019 | Publisher: | PERGAMON-ELSEVIER SCIENCE LTD | Source: | CARBON, 145, p. 740-750 | Abstract: | Non-contact and non-destructive electrical conductivity measurements of nitrogen doped nanocrystalline diamond films have been demonstrated using a microwave cavity perturbation system. The conductivity of the films was controlled by simply varying the CH4 gas concentration during microwave plasma assisted chemical vapour deposition, thereby promoting the formation of sp(2) carbon at the grain boundaries. The presence of sp(2) carbon is verified through Raman spectroscopy, x-ray photoelectron spectroscopy and electron energy loss spectroscopy, while scanning electron microscopy confirms an increasing surface area for sp(2) to form. The microwave cavity perturbation results show that the measured cavity quality factor varies with CH4 concentration. The extraction of conductivity is achieved through a depolarisation model, which must be considered when the sample is smaller than the cavity and through both electric and magnetic field perturbations. The microwave measurements are comparable to contacting and damaging measurements when the film conductivity is greater than the substrate, thus demonstrating an invaluable method for determining conductivity without the need for depositing any electrodes on the film. (c) 2019 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). | Notes: | [Cuenca, Jerome A.; Williams, Oliver A.] Cardiff Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales. [Sankaran, Kamatchi Jothiramalingam; Pobedinskas, Paulius; Haenen, Ken] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Sankaran, Kamatchi Jothiramalingam; Pobedinskas, Paulius; Haenen, Ken] IMEC VZW, IMOMEC, B-3590 Diepenbeek, Belgium. [Panda, Kalpataru] Inst for Basic Sci Korea, Ctr Nanomat & Chem React, Daejeon 34141, South Korea. [Lin, I-Nan] Tamkang Univ, Dept Phys, Tamsui 251, Taiwan. [Porch, Adrian] Cardiff Sch Engn, Cardiff CF24 3AA, S Glam, Wales. | Keywords: | Electrical conductivity; Non-contact; Nano-crystalline diamond; Microwave dielectric spectroscopy;Electrical conductivity; Non-contact; Nano-crystalline diamond; Microwave dielectric spectroscopy | Document URI: | http://hdl.handle.net/1942/29010 | ISSN: | 0008-6223 | e-ISSN: | 1873-3891 | DOI: | 10.1016/j.carbon.2018.12.025 | ISI #: | 000466073000079 | Rights: | 019 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license(http://creativecommons.org/licenses/by/4.0/). | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2020 |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
cuenca 1.pdf | Published version | 2.65 MB | Adobe PDF | View/Open |
SCOPUSTM
Citations
3
checked on Sep 2, 2020
WEB OF SCIENCETM
Citations
21
checked on Oct 8, 2024
Page view(s)
116
checked on Sep 7, 2022
Download(s)
156
checked on Sep 7, 2022
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.