Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2905
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dc.contributor.authorFlueraru, C-
dc.contributor.authorSchrader, S-
dc.contributor.authorZauls, V-
dc.contributor.authorMotschmann, H-
dc.contributor.authorStiller, B-
dc.contributor.authorKIEBOOMS, Rafael-
dc.date.accessioned2007-11-20T12:44:54Z-
dc.date.available2007-11-20T12:44:54Z-
dc.date.issued2000-
dc.identifier.citationSYNTHETIC METALS, 111. p. 603-606-
dc.identifier.issn0379-6779-
dc.identifier.urihttp://hdl.handle.net/1942/2905-
dc.description.abstractWe have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved.-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.subject.otherexperimental methods; ellipsometry; atomic force microscopy; materials-
dc.titleEllipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films-
dc.typeJournal Contribution-
dc.identifier.epage606-
dc.identifier.spage603-
dc.identifier.volume111-
local.format.pages4-
local.bibliographicCitation.jcatA1-
dc.description.notesMax Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0379-6779(99)00318-5-
dc.identifier.isi000087496300137-
item.contributorFlueraru, C-
item.contributorSchrader, S-
item.contributorZauls, V-
item.contributorMotschmann, H-
item.contributorStiller, B-
item.contributorKIEBOOMS, Rafael-
item.accessRightsClosed Access-
item.fullcitationFlueraru, C; Schrader, S; Zauls, V; Motschmann, H; Stiller, B & KIEBOOMS, Rafael (2000) Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films. In: SYNTHETIC METALS, 111. p. 603-606.-
item.fulltextNo Fulltext-
item.validationecoom 2001-
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