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http://hdl.handle.net/1942/2905
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DC Field | Value | Language |
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dc.contributor.author | Flueraru, C | - |
dc.contributor.author | Schrader, S | - |
dc.contributor.author | Zauls, V | - |
dc.contributor.author | Motschmann, H | - |
dc.contributor.author | Stiller, B | - |
dc.contributor.author | KIEBOOMS, Rafael | - |
dc.date.accessioned | 2007-11-20T12:44:54Z | - |
dc.date.available | 2007-11-20T12:44:54Z | - |
dc.date.issued | 2000 | - |
dc.identifier.citation | SYNTHETIC METALS, 111. p. 603-606 | - |
dc.identifier.issn | 0379-6779 | - |
dc.identifier.uri | http://hdl.handle.net/1942/2905 | - |
dc.description.abstract | We have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved. | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject.other | experimental methods; ellipsometry; atomic force microscopy; materials | - |
dc.title | Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 606 | - |
dc.identifier.spage | 603 | - |
dc.identifier.volume | 111 | - |
local.format.pages | 4 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Max Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1016/S0379-6779(99)00318-5 | - |
dc.identifier.isi | 000087496300137 | - |
item.contributor | Flueraru, C | - |
item.contributor | Schrader, S | - |
item.contributor | Zauls, V | - |
item.contributor | Motschmann, H | - |
item.contributor | Stiller, B | - |
item.contributor | KIEBOOMS, Rafael | - |
item.accessRights | Closed Access | - |
item.fullcitation | Flueraru, C; Schrader, S; Zauls, V; Motschmann, H; Stiller, B & KIEBOOMS, Rafael (2000) Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films. In: SYNTHETIC METALS, 111. p. 603-606. | - |
item.fulltext | No Fulltext | - |
item.validation | ecoom 2001 | - |
Appears in Collections: | Research publications |
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