Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2932
Full metadata record
DC FieldValueLanguage
dc.contributor.authorSaerens, A-
dc.contributor.authorVan Houtte, P-
dc.contributor.authorMEERT, Bart-
dc.contributor.authorQUAEYHAEGENS, Carl-
dc.date.accessioned2007-11-20T13:52:42Z-
dc.date.available2007-11-20T13:52:42Z-
dc.date.issued2000-
dc.identifier.citationJOURNAL OF APPLIED CRYSTALLOGRAPHY, 33. p. 312-322-
dc.identifier.issn0021-8898-
dc.identifier.urihttp://hdl.handle.net/1942/2932-
dc.description.abstractThree different X-ray stress measuring techniques have been applied to thin titanium nitride coatings: the classical d-sin(2)psi method, a low incident-beam-angle method and the crystallite-group method. The results are used for a comparison of the three methods. The influence of the crystallographic texture is studied by considering a set of coatings with a strong (111) fibre texture and another set with a weaker and mixed fibre texture. It is shown that no significant differences in the stresses in the latter coatings are found using the three methods, whereas the coatings with strong (111) fibre texture exhibit compressive stresses that are significantly higher when the crystallite-group method is used. This is explained by the fact that (111)-oriented grains sustain stresses that are about 30% higher than those of the grains that show a deviation of 10 degrees from this orientation. Non-linearities in the d-sin(2)psi curves are reported that cannot be explained by means of linear elastic theories. (C) 2000 International Union of Crystallography Printed in Great Britain - all rights reserved.-
dc.language.isoen-
dc.publisherMUNKSGAARD INT PUBL LTD-
dc.titleAssessment of different X-ray stress measuring techniques for thin titanium nitride coatings-
dc.typeJournal Contribution-
dc.identifier.epage322-
dc.identifier.spage312-
dc.identifier.volume33-
local.format.pages11-
local.bibliographicCitation.jcatA1-
dc.description.notesKatholieke Univ Leuven, Dept Met & Mat Engn, B-3001 Louvain, Belgium. Limburgs Univ Ctr, Inst Mat Res, Diepenbeek, Belgium.Saerens, A, Katholieke Univ Leuven, Dept Met & Mat Engn, De Croylaan 2, B-3001 Louvain, Belgium.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.isi000086740300016-
item.contributorSaerens, A-
item.contributorVan Houtte, P-
item.contributorMEERT, Bart-
item.contributorQUAEYHAEGENS, Carl-
item.accessRightsClosed Access-
item.fullcitationSaerens, A; Van Houtte, P; MEERT, Bart & QUAEYHAEGENS, Carl (2000) Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings. In: JOURNAL OF APPLIED CRYSTALLOGRAPHY, 33. p. 312-322.-
item.fulltextNo Fulltext-
item.validationecoom 2001-
Appears in Collections:Research publications
Show simple item record

WEB OF SCIENCETM
Citations

20
checked on Apr 24, 2024

Page view(s)

102
checked on Nov 7, 2023

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.