Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/30010
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dc.contributor.authorRibeiro-Andrade, Rodrigo-
dc.contributor.authorSahayaraj, Sylvester-
dc.contributor.authorVERMANG, Bart-
dc.contributor.authorCorreia, M. Rosario-
dc.contributor.authorSadewasser, Sascha-
dc.contributor.authorGonzalez, Juan Carlos-
dc.contributor.authorFernandes, Paulo A.-
dc.contributor.authorSalome, Pedro M. P.-
dc.date.accessioned2019-11-18T13:26:26Z-
dc.date.available2019-11-18T13:26:26Z-
dc.date.issued2019-
dc.identifier.citationIEEE JOURNAL OF PHOTOVOLTAICS, 9(2), p. 565-570-
dc.identifier.issn2156-3381-
dc.identifier.urihttp://hdl.handle.net/1942/30010-
dc.description.abstractKesterite solar cells based on Cu2ZnSnS4 and Cu2ZnSnS4 (CZTSe) are potential future candidates to be used in thin-film solar cells. The technology still has to he developed to a great extent and for this to happen, high levels of confidence in the characterization methods are required, so that improvements can he made on solid interpretations. In this study, we show that the interpretations of one of the most used characterization techniques in kesterites, scanning transmission electron microscopy (STEM), might be affected by its specimen preparation when using focused ion beam (FIB). Using complementary measurements based on scanning electron microscopy and Raman scattering spectroscopy, compelling evidence shows that secondary phases of ZnSe mixed in the bulk of CZTSe are the likely cause of the appearance of voids in STEM lamellae. Sputtering simulations support this interpretation by showing that Zn in a ZnSe matrix is preferentially sputtered compared with any metal atom in a CZTSe matrix.-
dc.description.sponsorshipThis work was supported in part by the FEDER funds through the COMPETE 2020 Programme, in part by FCT-Portuguese Foundation for Science and Technology under Project UID/CTM/50025/2013, in part by CAPES (CAPES-INL 04/14), in part by FAPEMIG, and in part by CNPq Brazilian agencies. The work of B. Vermang was supported by the European Research Council under the European Union's Horizon 2020 Research and Innovation Programme under Grant Agreement 715027. The work of P. M. P. Salome was supported in part by the Fundacao para Ciencia e Tecnologia (FCT) under Project IF/00133/2015 and in part by the NovaCell-Development of Novel Ultrathin Solar Cell Architectures for Low-Light, Low-Cost, and Flexible Opto-Electronic Devices Project (028075) co-funded by FCT and the ERDF under Grant COMPETE2020.-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.rightsOpen Access-
dc.subject.otherEnergy & Fuels; Materials Science, Multidisciplinary; Physics, Applied-
dc.subject.otherCu2ZnSn(S, Se)(4) (CZTSSe); focused ion beam (FIB); kesterite; thin-film solar cells; transmission electron microscopy (TEM)-
dc.titleVoids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses-
dc.typeJournal Contribution-
dc.identifier.epage570-
dc.identifier.issue2-
dc.identifier.spage565-
dc.identifier.volume9-
local.format.pages6-
local.bibliographicCitation.jcatA1-
dc.description.notes[Ribeiro-Andrade, Rodrigo; Sadewasser, Sascha; Fernandes, Paulo A.; Salome, Pedro M. P.] Int Iberian Nanotechnol Lab, P-4715330 Braga, Portugal. [Ribeiro-Andrade, Rodrigo; Gonzalez, Juan Carlos] Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil. [Sahayaraj, Sylvester; Vermang, Bart] Imec Partner Solliance, B-3001 Leuven, Belgium. [Vermang, Bart] Imomec Partner Solliance, B-3590 Diepenbeek, Belgium. [Vermang, Bart] Univ Hasselt Partner Solliance, B-3590 Diepenbeek, Belgium. [Correia, M. Rosario] Univ Aveiro, Dept Fis, P-3810193 Aveiro, Portugal. [Correia, M. Rosario; Fernandes, Paulo A.; Salome, Pedro M. P.] Univ Aveiro, I3N, P-3810193 Aveiro, Portugal. [Fernandes, Paulo A.] Inst Politecn Porto, CIETI, Dept Fis, Inst Super Engn Porto, P-4200072 Porto, Portugal.-
local.publisher.placePISCATAWAY-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1109/JPHOTOV.2018.2889602-
dc.identifier.isi000459507000028-
item.fullcitationRibeiro-Andrade, Rodrigo; Sahayaraj, Sylvester; VERMANG, Bart; Correia, M. Rosario; Sadewasser, Sascha; Gonzalez, Juan Carlos; Fernandes, Paulo A. & Salome, Pedro M. P. (2019) Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses. In: IEEE JOURNAL OF PHOTOVOLTAICS, 9(2), p. 565-570.-
item.fulltextWith Fulltext-
item.validationecoom 2020-
item.contributorRibeiro-Andrade, Rodrigo-
item.contributorSahayaraj, Sylvester-
item.contributorVERMANG, Bart-
item.contributorCorreia, M. Rosario-
item.contributorSadewasser, Sascha-
item.contributorGonzalez, Juan Carlos-
item.contributorFernandes, Paulo A.-
item.contributorSalome, Pedro M. P.-
item.accessRightsOpen Access-
crisitem.journal.issn2156-3381-
crisitem.journal.eissn2156-3403-
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