Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/30038
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dc.contributor.authorTHIRUVALLUR EACHAMBADI, Ragha-
dc.contributor.authorBoschker, Henricus T. S.-
dc.contributor.authorSpampinato, Valentina-
dc.contributor.authorFranquet, Alexis-
dc.contributor.authorHidalgo-Martinez, Silvia-
dc.contributor.authorVALCKE, Roland-
dc.contributor.authorMeysman, Filip J.R.-
dc.contributor.authorMANCA, Jean-
dc.date.accessioned2019-11-21T11:35:59Z-
dc.date.available2019-11-21T11:35:59Z-
dc.date.issued2019-
dc.identifier.citation22nd International Conference on Secondary Ion Mass Spectrometry – SIMS-22, Kyoto, Japan, 20-25 October 2019-
dc.identifier.urihttp://hdl.handle.net/1942/30038-
dc.language.isoen-
dc.titleCombined TOF-SIMS/SPM characterization of cable bacteria – living electrical bacteria for next generation bioelectronics?-
dc.typeConference Material-
local.bibliographicCitation.conferencedate20-25 October 2019-
local.bibliographicCitation.conferencename22nd International Conference on Secondary Ion Mass Spectrometry – SIMS-22-
local.bibliographicCitation.conferenceplaceKyoto, Japan-
local.bibliographicCitation.jcatC2-
local.type.refereedRefereed-
local.type.specifiedPaper-
item.contributorTHIRUVALLUR EACHAMBADI, Ragha-
item.contributorBoschker, Henricus T. S.-
item.contributorSpampinato, Valentina-
item.contributorFranquet, Alexis-
item.contributorHidalgo-Martinez, Silvia-
item.contributorVALCKE, Roland-
item.contributorMeysman, Filip J.R.-
item.contributorMANCA, Jean-
item.fullcitationTHIRUVALLUR EACHAMBADI, Ragha; Boschker, Henricus T. S.; Spampinato, Valentina; Franquet, Alexis; Hidalgo-Martinez, Silvia; VALCKE, Roland; Meysman, Filip J.R. & MANCA, Jean (2019) Combined TOF-SIMS/SPM characterization of cable bacteria – living electrical bacteria for next generation bioelectronics?. In: 22nd International Conference on Secondary Ion Mass Spectrometry – SIMS-22, Kyoto, Japan, 20-25 October 2019.-
item.accessRightsRestricted Access-
item.fulltextWith Fulltext-
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