Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3021
Title: Low temperature photoconductivity detection of phosphorus in diamond
Authors: HAENEN, Ken 
MEYKENS, Kristien 
NESLADEK, Milos 
KNUYT, Gilbert 
QUAEYHAEGENS, Carl 
STALS, Lambert 
Koizumi, S
Gheeraert, E
Issue Date: 1999
Publisher: WILEY-V C H VERLAG GMBH
Source: PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 174(1). p. 53-58
Abstract: Photocurrent measurements and the Constant Photocurrent Method (CPM) were used to carry out a spectroscopic study of epitaxial phosphorus-doped n-type CVD diamond films. Two optically active defect levels, X-P1 and X-P2, With photoionisation energy of 0.56 and 0.81 eV, respectively, found in previous work [1] are discussed in detail here. Comparison of CPM data with the activation energy of the carriers from Hall effect measurements suggest that the X-P1 defect can be attributed to the P-related donor level. X-P2 remains unidentified. Measurements carried out on a set of samples show that the X-P2 defect is only present in some samples showing high resistivity. To study the electronic structure of the X-P1 level, photocurrent measurements at low temperatures (liquid N-2 and liquid He) were done, revealing a phonon-induced oscillatory photoconductivity. Two sets of minima are observed which allow an estimation of the position of the first two excited states of phosphorus. Also a comparison is made with results from FTIR measurements.
Notes: Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. Natl Inst Res Inorgan Mat, Ctr Adv Mat Res, Tsukuba, Ibaraki 305, Japan. CNRS, Etud Proprietes Elect Solides Lab, Grenoble 9, France.Haenen, K, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Univ Campus,Wetenschapspk 1, B-3590 Diepenbeek, Belgium.
Document URI: http://hdl.handle.net/1942/3021
DOI: 10.1002/(SICI)1521-396X(199907)174:1<53::AID-PSSA53>3.0.CO;2-9
ISI #: 000081733800012
Type: Journal Contribution
Validations: ecoom 2000
Appears in Collections:Research publications

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