Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/31088
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dc.contributor.authorOUDEBROUCKX, Gilles-
dc.contributor.authorVANDENRYT, Thijs-
dc.contributor.authorWAGNER, Patrick-
dc.contributor.authorTHOELEN, Ronald-
dc.date.accessioned2020-04-22T14:13:29Z-
dc.date.available2020-04-22T14:13:29Z-
dc.date.issued2019-
dc.date.submitted2020-04-20T07:45:13Z-
dc.identifier.citationNanotechnology crossing borders, Uhasselt University - Hasselt (Limburg), Belgium, 26/09/2019-26/09/2019-
dc.identifier.urihttp://hdl.handle.net/1942/31088-
dc.language.isoen-
dc.titleOptimizing a thermal based sensor setup for monitoring physical changes of thin films over time using numerical modeling (NanotechCrossingBorders_poster 2019)-
dc.typeConference Material-
local.bibliographicCitation.conferencedate26/09/2019-26/09/2019-
local.bibliographicCitation.conferencenameNanotechnology crossing borders-
local.bibliographicCitation.conferenceplaceUhasselt University - Hasselt (Limburg), Belgium-
local.bibliographicCitation.jcatC2-
local.type.refereedNon-Refereed-
local.type.specifiedConference Poster-
local.provider.typePdf-
local.uhasselt.uhpubno-
item.fulltextWith Fulltext-
item.accessRightsRestricted Access-
item.fullcitationOUDEBROUCKX, Gilles; VANDENRYT, Thijs; WAGNER, Patrick & THOELEN, Ronald (2019) Optimizing a thermal based sensor setup for monitoring physical changes of thin films over time using numerical modeling (NanotechCrossingBorders_poster 2019). In: Nanotechnology crossing borders, Uhasselt University - Hasselt (Limburg), Belgium, 26/09/2019-26/09/2019.-
item.contributorOUDEBROUCKX, Gilles-
item.contributorVANDENRYT, Thijs-
item.contributorWAGNER, Patrick-
item.contributorTHOELEN, Ronald-
Appears in Collections:Research publications
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