Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/31090
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dc.contributor.advisorThoelen, Ronald-
dc.contributor.authorOUDEBROUCKX, Gilles-
dc.contributor.authorTHOELEN, Ronald-
dc.date.accessioned2020-04-22T14:24:48Z-
dc.date.available2020-04-22T14:24:48Z-
dc.date.issued2019-
dc.date.submitted2020-04-20T08:31:54Z-
dc.identifier.citationMeeting Point Functional Layers - 1st MPFL Research Symposium, University of Lisbon -Lisbon, Portugal, 05/09/2019-06/09/2019-
dc.identifier.urihttp://hdl.handle.net/1942/31090-
dc.language.isoen-
dc.titleThermal sensor for monitoring physical changes of thin films over time-
dc.typeConference Material-
local.bibliographicCitation.conferencedate05/09/2019-06/09/2019-
local.bibliographicCitation.conferencenameMeeting Point Functional Layers - 1st MPFL Research Symposium-
local.bibliographicCitation.conferenceplaceUniversity of Lisbon -Lisbon, Portugal-
local.format.pages70-
local.bibliographicCitation.jcatC2-
local.type.refereedNon-Refereed-
local.type.specifiedConference Presentation-
local.uhasselt.uhpubno-
item.contributorOUDEBROUCKX, Gilles-
item.contributorTHOELEN, Ronald-
item.accessRightsRestricted Access-
item.fullcitationOUDEBROUCKX, Gilles & THOELEN, Ronald (2019) Thermal sensor for monitoring physical changes of thin films over time. In: Meeting Point Functional Layers - 1st MPFL Research Symposium, University of Lisbon -Lisbon, Portugal, 05/09/2019-06/09/2019.-
item.fulltextWith Fulltext-
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