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http://hdl.handle.net/1942/31838
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DC Field | Value | Language |
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dc.contributor.author | Shikata, Shinichi | - |
dc.contributor.author | Yamaguchi, Koji | - |
dc.contributor.author | Fujiwara, Akihiko | - |
dc.contributor.author | Tamenori, Yusuke | - |
dc.contributor.author | Tsuruta, Kazuki | - |
dc.contributor.author | Yamada, Takatoshi | - |
dc.contributor.author | NICLEY, Shannon | - |
dc.contributor.author | HAENEN, Ken | - |
dc.contributor.author | Koizumi, Satoshi | - |
dc.date.accessioned | 2020-08-26T09:15:02Z | - |
dc.date.available | 2020-08-26T09:15:02Z | - |
dc.date.issued | 2020 | - |
dc.date.submitted | 2020-08-20T09:28:47Z | - |
dc.identifier.citation | DIAMOND AND RELATED MATERIALS, 105 (Art N° 107769) | - |
dc.identifier.uri | http://hdl.handle.net/1942/31838 | - |
dc.description.abstract | The P dopant site control in diamond is critical to achieve high mobility n type channels and high concentration n+ layers for power device applications. In this study, the P doped diamond films grown by three institutes with varying hydrogen and dopant concentrations were analyzed by X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS). By XANES, the film with high H concentration (4.0 x 10(19) cm(-3)) was estimated to show a higher peak intensity of 2147.7 eV than that of a low H concentration film. H was likely to be incorporated in the diamond as P-H at the substitutional sites under H rich growth condition. Another film showed considerably low peak intensities at 2147.7 and 2148.6 eV because of the "substitutional with H" and "substitutional" sites, respectively. The EXAFS result revealed that the first nearest neighbor distance is slightly shifted from the "substitutional" to "interstitial" site. The low P concentration film showed different types of energy profiles, particularly in the high energy region, indicating that dopant sites change with dopant concentration. Overall, the P dopant site is likely to be influenced by the machine system, H and P concentrations. | - |
dc.description.sponsorship | This work was supported in part by JSPS KAKENHI Grant Number 19H02617. Synchrotron radiation experiments were carried out with the approval of the Japan Synchrotron Radiation Research Institute (Proposal 2015B1795, 2017A1540). | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.rights | 2020 Elsevier B.V. All rights reserved. | - |
dc.subject.other | n type doping | - |
dc.subject.other | P doping | - |
dc.subject.other | Power device | - |
dc.subject.other | XAFS | - |
dc.title | X-ray absorption near edge structure and extended X-ray absorption fine structure studies of P doped (111) diamond | - |
dc.type | Journal Contribution | - |
dc.identifier.volume | 105 | - |
local.format.pages | 6 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Shikata, S (corresponding author), Kwansei Gakuin Univ KGU, Sch Sci & Technol, Nishinomiya, Hyogo, Japan. | - |
dc.description.notes | SShikata@kwansei.ac.jp | - |
dc.description.other | Shikata, S (corresponding author), Kwansei Gakuin Univ KGU, Sch Sci & Technol, Nishinomiya, Hyogo, Japan. SShikata@kwansei.ac.jp | - |
local.publisher.place | PO BOX 564, 1001 LAUSANNE, SWITZERLAND | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
local.bibliographicCitation.artnr | 107769 | - |
dc.identifier.doi | 10.1016/j.diamond.2020.107769 | - |
dc.identifier.isi | WOS:000540291200007 | - |
dc.contributor.orcid | Nicley, Shannon/0000-0002-5960-7873 | - |
local.provider.type | wosris | - |
local.uhasselt.uhpub | yes | - |
local.description.affiliation | [Shikata, Shinichi; Yamaguchi, Koji; Fujiwara, Akihiko] Kwansei Gakuin Univ KGU, Sch Sci & Technol, Nishinomiya, Hyogo, Japan. | - |
local.description.affiliation | [Tamenori, Yusuke; Tsuruta, Kazuki] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo, Japan. | - |
local.description.affiliation | [Yamada, Takatoshi] Natl Inst Adv Ind Sci & Technol, Ibaraki, Japan. | - |
local.description.affiliation | [Nicley, Shannon S.; Haenen, Ken] Hasselt Univ, Inst Mat Res IMO, Diepenbeek, Belgium. | - |
local.description.affiliation | [Nicley, Shannon S.; Haenen, Ken] IMEC VZW, IMOMEC, Diepenbeek, Belgium. | - |
local.description.affiliation | [Koizumi, Satoshi] Natl Inst Mat Sci NIMS, Ibaraki, Japan. | - |
local.description.affiliation | [Yamaguchi, Koji] Murata Mfg Co Ltd, Kyoto, Japan. | - |
local.description.affiliation | [Nicley, Shannon S.] Univ Oxford, Dept Mat, Oxford, England. | - |
local.uhasselt.international | yes | - |
item.fulltext | With Fulltext | - |
item.validation | ecoom 2021 | - |
item.accessRights | Restricted Access | - |
item.fullcitation | Shikata, Shinichi; Yamaguchi, Koji; Fujiwara, Akihiko; Tamenori, Yusuke; Tsuruta, Kazuki; Yamada, Takatoshi; NICLEY, Shannon; HAENEN, Ken & Koizumi, Satoshi (2020) X-ray absorption near edge structure and extended X-ray absorption fine structure studies of P doped (111) diamond. In: DIAMOND AND RELATED MATERIALS, 105 (Art N° 107769). | - |
item.contributor | Shikata, Shinichi | - |
item.contributor | Yamaguchi, Koji | - |
item.contributor | Fujiwara, Akihiko | - |
item.contributor | Tamenori, Yusuke | - |
item.contributor | Tsuruta, Kazuki | - |
item.contributor | Yamada, Takatoshi | - |
item.contributor | NICLEY, Shannon | - |
item.contributor | HAENEN, Ken | - |
item.contributor | Koizumi, Satoshi | - |
crisitem.journal.issn | 0925-9635 | - |
crisitem.journal.eissn | 1879-0062 | - |
Appears in Collections: | Research publications |
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File | Description | Size | Format | |
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shikata.pdf Restricted Access | Published version | 1.73 MB | Adobe PDF | View/Open Request a copy |
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