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http://hdl.handle.net/1942/3195
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DC Field | Value | Language |
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dc.contributor.author | MANCA, Jean | - |
dc.contributor.author | CROES, Kristof | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | STALS, Lambert | - |
dc.contributor.author | Jacques, L | - |
dc.contributor.author | Tielemans, L | - |
dc.contributor.author | Gerrits, N | - |
dc.contributor.author | Hoppener, R | - |
dc.date.accessioned | 2007-11-27T08:51:32Z | - |
dc.date.available | 2007-11-27T08:51:32Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68 | - |
dc.identifier.issn | 0748-8017 | - |
dc.identifier.uri | http://hdl.handle.net/1942/3195 | - |
dc.description.abstract | The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps, Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. (C) 1998 John Wiley & Sons, Ltd. | - |
dc.language.iso | en | - |
dc.publisher | JOHN WILEY & SONS LTD | - |
dc.subject.other | capacitors; reliability; leakage current; in situ electrical measurement technique; statistical reliability analysis | - |
dc.title | Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 68 | - |
dc.identifier.issue | 2 | - |
dc.identifier.spage | 63 | - |
dc.identifier.volume | 14 | - |
local.format.pages | 6 | - |
dc.description.notes | Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. Philips Components Ind, B-8800 Roeselare, Belgium. DESTIN NV, B-3590 Diepenbeek, Belgium. DSM Solutech, NL-6422 PN Heerlen, Netherlands.Manca, JV, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Wetenschapspk 1, B-3590 Diepenbeek, Belgium. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P | - |
dc.identifier.isi | 000073717800002 | - |
item.fullcitation | MANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N & Hoppener, R (1998) Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements. In: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68. | - |
item.validation | ecoom 1999 | - |
item.accessRights | Closed Access | - |
item.fulltext | No Fulltext | - |
item.contributor | MANCA, Jean | - |
item.contributor | CROES, Kristof | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | STALS, Lambert | - |
item.contributor | Jacques, L | - |
item.contributor | Tielemans, L | - |
item.contributor | Gerrits, N | - |
item.contributor | Hoppener, R | - |
Appears in Collections: | Research publications |
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