Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3195
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dc.contributor.authorMANCA, Jean-
dc.contributor.authorCROES, Kristof-
dc.contributor.authorDE SCHEPPER, Luc-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorSTALS, Lambert-
dc.contributor.authorJacques, L-
dc.contributor.authorTielemans, L-
dc.contributor.authorGerrits, N-
dc.contributor.authorHoppener, R-
dc.date.accessioned2007-11-27T08:51:32Z-
dc.date.available2007-11-27T08:51:32Z-
dc.date.issued1998-
dc.identifier.citationQUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68-
dc.identifier.issn0748-8017-
dc.identifier.urihttp://hdl.handle.net/1942/3195-
dc.description.abstractThe in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps, Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. (C) 1998 John Wiley & Sons, Ltd.-
dc.language.isoen-
dc.publisherJOHN WILEY & SONS LTD-
dc.subject.othercapacitors; reliability; leakage current; in situ electrical measurement technique; statistical reliability analysis-
dc.titleElectrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements-
dc.typeJournal Contribution-
dc.identifier.epage68-
dc.identifier.issue2-
dc.identifier.spage63-
dc.identifier.volume14-
local.format.pages6-
dc.description.notesLimburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. Philips Components Ind, B-8800 Roeselare, Belgium. DESTIN NV, B-3590 Diepenbeek, Belgium. DSM Solutech, NL-6422 PN Heerlen, Netherlands.Manca, JV, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P-
dc.identifier.isi000073717800002-
item.fullcitationMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N & Hoppener, R (1998) Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements. In: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68.-
item.fulltextNo Fulltext-
item.accessRightsClosed Access-
item.validationecoom 1999-
item.contributorMANCA, Jean-
item.contributorHoppener, R-
item.contributorCROES, Kristof-
item.contributorDE CEUNINCK, Ward-
item.contributorGerrits, N-
item.contributorTielemans, L-
item.contributorDE SCHEPPER, Luc-
item.contributorJacques, L-
item.contributorSTALS, Lambert-
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