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http://hdl.handle.net/1942/3229
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DC Field | Value | Language |
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dc.contributor.author | NESLADEK, Milos | - |
dc.contributor.author | STALS, Lambert | - |
dc.contributor.author | Stesmans, A | - |
dc.contributor.author | Iakoubovskij, K | - |
dc.contributor.author | ADRIAENSENS, Peter | - |
dc.date.accessioned | 2007-11-27T10:59:32Z | - |
dc.date.available | 2007-11-27T10:59:32Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, 72(25). p. 3306-3308 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/1942/3229 | - |
dc.description.abstract | Characteristic features in photocurrent (PC) and electron paramagnetic resonance (EPR) spectra are discussed and attributed to main defects in the gap of optical-quality chemical vapor deposited diamond. A shoulder in the PC spectra with an onset at about 2.2 eV is attributed to the single-substitutional nitrogen defect (EPR P1 resonance at g = 2.0024). A second feature in the PC spectra with an onset of about 1.3 eV is observed on "as-grown" samples with a hydrogen terminated surface. The defect level associated with this feature is hydrogen related, and this defect disappears after oxidation of the diamond sample surface. The EPR g = 2.0028, which was also suggested to be H-related, is discussed. (C) 1998 American Institute of Physics. [S0003-6951(98)01525-3]. | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Dominant defect levels in diamond thin films: A photocurrent and electron paramagnetic resonance study | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 3308 | - |
dc.identifier.issue | 25 | - |
dc.identifier.spage | 3306 | - |
dc.identifier.volume | 72 | - |
local.format.pages | 3 | - |
dc.description.notes | Limburgs Univ Ctr, Div Mat Phys, Mat Res Inst, B-3590 Diepenbeek, Belgium. Katholieke Univ Leuven, Lab Halfgeleiderfys, B-3001 Heverlee, Belgium. Acad Sci Czech Republ, Inst Phys, CZ-16253 Prague, Czech Republic.Nesladek, M, Limburgs Univ Ctr, Div Mat Phys, Mat Res Inst, Univ Campus,Wetenschapspk 1, B-3590 Diepenbeek, Belgium. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1063/1.121632 | - |
dc.identifier.isi | 000075274400022 | - |
item.validation | ecoom 1999 | - |
item.fulltext | No Fulltext | - |
item.fullcitation | NESLADEK, Milos; STALS, Lambert; Stesmans, A; Iakoubovskij, K & ADRIAENSENS, Peter (1998) Dominant defect levels in diamond thin films: A photocurrent and electron paramagnetic resonance study. In: APPLIED PHYSICS LETTERS, 72(25). p. 3306-3308. | - |
item.accessRights | Closed Access | - |
item.contributor | NESLADEK, Milos | - |
item.contributor | STALS, Lambert | - |
item.contributor | Stesmans, A | - |
item.contributor | Iakoubovskij, K | - |
item.contributor | ADRIAENSENS, Peter | - |
Appears in Collections: | Research publications |
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