Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3232
Title: Optical properties of microcrystalline materials
Authors: Vanecek, M
Poruba, A
REMES, Zdenek 
Beck, N.
NESLADEK, Milos 
Issue Date: 1998
Publisher: ELSEVIER SCIENCE BV
Source: JOURNAL OF NON-CRYSTALLINE SOLIDS, 230. p. 967-972
Abstract: We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (mu c-Si) thin films and diamond layers. Enhanced light absorption in mu c-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, alpha, smaller than 0.1 cm(-1) at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency mu c-Si solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed. (C) 1998 Elsevier Science B.V. All rights reserved.
Notes: Acad Sci Czech Republ, Inst Phys, CZ-16200 Praha 6, Czech Republic. Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland. Limburgs Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Praha 6, Czech Republic.vanecek@fzu.cz
Keywords: microcrystalline silicon; thin films; diamonds
Document URI: http://hdl.handle.net/1942/3232
DOI: 10.1016/S0022-3093(98)00202-6
ISI #: 000074599000062
Type: Journal Contribution
Validations: ecoom 1999
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

75
checked on Sep 3, 2020

WEB OF SCIENCETM
Citations

70
checked on May 22, 2022

Page view(s)

50
checked on May 20, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.