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http://hdl.handle.net/1942/3232
Title: | Optical properties of microcrystalline materials | Authors: | Vanecek, M Poruba, A REMES, Zdenek Beck, N. NESLADEK, Milos |
Issue Date: | 1998 | Publisher: | ELSEVIER SCIENCE BV | Source: | JOURNAL OF NON-CRYSTALLINE SOLIDS, 230. p. 967-972 | Abstract: | We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (mu c-Si) thin films and diamond layers. Enhanced light absorption in mu c-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, alpha, smaller than 0.1 cm(-1) at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency mu c-Si solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed. (C) 1998 Elsevier Science B.V. All rights reserved. | Notes: | Acad Sci Czech Republ, Inst Phys, CZ-16200 Praha 6, Czech Republic. Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland. Limburgs Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Praha 6, Czech Republic.vanecek@fzu.cz | Keywords: | microcrystalline silicon; thin films; diamonds | Document URI: | http://hdl.handle.net/1942/3232 | DOI: | 10.1016/S0022-3093(98)00202-6 | ISI #: | 000074599000062 | Type: | Journal Contribution | Validations: | ecoom 1999 |
Appears in Collections: | Research publications |
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