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http://hdl.handle.net/1942/3235
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DC Field | Value | Language |
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dc.contributor.author | VLEKKEN, Johan | - |
dc.contributor.author | WU, Ting-Di | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.contributor.author | KNUYT, Gilbert | - |
dc.contributor.author | Vandervorst, W | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.date.accessioned | 2007-11-27T12:13:55Z | - |
dc.date.available | 2007-11-27T12:13:55Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 9(6). p. 638-642 | - |
dc.identifier.issn | 1044-0305 | - |
dc.identifier.uri | http://hdl.handle.net/1942/3235 | - |
dc.description.abstract | A new quantitation method, based on the detection of M-2(+) molecular ions, is presented. It has been shown that M-2(+) molecular ions are formed by a recombination process between independently sputtered M and M+ particles. Based on this formation mechanism, it will be demonstrated that M-2(+) molecular ions can be used to quantitate major elements. The method will be used for quantitation of an AlxGa1-xAs multilayer. Furthermore, it will be shown that some matrix effects can be explained by the energy dependence of instrument transmission. (C) 1998 American Society for Mass Spectrometry. | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE INC | - |
dc.title | Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 642 | - |
dc.identifier.issue | 6 | - |
dc.identifier.spage | 638 | - |
dc.identifier.volume | 9 | - |
local.format.pages | 5 | - |
dc.description.notes | Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. IMEC VZW, Leuven, Belgium.Vlekken, J, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Univ Campus,Wetenschapspark 1, B-3590 Diepenbeek, Belgium. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1016/S1044-0305(98)00028-2 | - |
dc.identifier.isi | 000073734700010 | - |
item.fulltext | No Fulltext | - |
item.contributor | VLEKKEN, Johan | - |
item.contributor | WU, Ting-Di | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.contributor | KNUYT, Gilbert | - |
item.contributor | Vandervorst, W | - |
item.contributor | DE SCHEPPER, Luc | - |
item.fullcitation | VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W & DE SCHEPPER, Luc (1998) Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions. In: JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 9(6). p. 638-642. | - |
item.accessRights | Closed Access | - |
item.validation | ecoom 1999 | - |
Appears in Collections: | Research publications |
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