Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/32610
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | FUHRMANN, Marc | - |
dc.contributor.author | KRIVCOV, Alexander | - |
dc.contributor.author | Musyanovych, Anna | - |
dc.contributor.author | THOELEN, Ronald | - |
dc.contributor.author | Moebius, Hildegard | - |
dc.date.accessioned | 2020-11-16T14:30:14Z | - |
dc.date.available | 2020-11-16T14:30:14Z | - |
dc.date.issued | 2020 | - |
dc.date.submitted | 2020-10-21T10:58:14Z | - |
dc.identifier.citation | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 217 (13) (Art N° 1900828) | - |
dc.identifier.uri | http://hdl.handle.net/1942/32610 | - |
dc.description.abstract | Topographic cross-talk is still an issue in magnetic force microscopy (MFM) as well as in electric force microscopy (EFM). Using interleave mode measurements, combining a first topographic scan with a second scan in a certain distance from the surface following the topography from the first scan, capacitive coupling effects occur while measuring nanoparticles. This article focuses on the influence of the dielectric constant of polystyrene nanoparticles in interleave mode MFM measurements. To investigate the contribution of the capacitive coupling effect to the signal, nonmagnetic polystyrene nanoparticles are investigated. The tip-substrate distance change above the nanoparticle leads to a positive phase shift in MFM signals. Simulations and fits to the experimental data allow the investigation of the influence of the dielectric constant of the nanoparticles on topographic effects in interleave mode measurements in general. | - |
dc.description.sponsorship | The presented results are part of the ongoing InnoProm-project “TRAPP – Nanocarrier in carrier matrix for transdermal applications” co-funded by the German state Rhineland-Palatinate, the European Funds for Regional Development (EFRE), and Karl Otto Braun GmbH & Co. Kg. The authors also acknowledge Rainer Lilischkis for the support in SEM measurements. | - |
dc.language.iso | en | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.rights | © 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited | - |
dc.subject.other | capacitive coupling | - |
dc.subject.other | dielectric constant of nanoparticles | - |
dc.subject.other | electric force microscopy | - |
dc.subject.other | magnetic force microscopy | - |
dc.title | The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy | - |
dc.type | Journal Contribution | - |
dc.identifier.issue | 13 | - |
dc.identifier.volume | 217 | - |
local.format.pages | 6 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | M?bius, H (corresponding author), Univ Appl Sci Kaiserslautern, Dept Comp Sci Micro Syst Technol, Amerikastr 1, D-66482 Zweibrucken, Germany. | - |
dc.description.notes | Hildegard.Moebius@hs-kl.de | - |
dc.description.other | M?bius, H (corresponding author), Univ Appl Sci Kaiserslautern, Dept Comp Sci Micro Syst Technol, Amerikastr 1, D-66482 Zweibrucken, Germany Hildegard.Moebius@hs-kl.de | - |
local.publisher.place | POSTFACH 101161, 69451 WEINHEIM, GERMANY | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
local.bibliographicCitation.artnr | 1900828 | - |
dc.identifier.doi | 10.1002/pssa.201900828 | - |
dc.identifier.isi | WOS:000552069000004 | - |
local.provider.type | wosris | - |
local.uhasselt.uhpub | yes | - |
local.description.affiliation | [Fuhrmann, Marc; Krivcov, Alexander; Moebius, Hildegard] Univ Appl Sci Kaiserslautern, Dept Comp Sci Micro Syst Technol, Amerikastr 1, D-66482 Zweibrucken, Germany. | - |
local.description.affiliation | [Musyanovych, Anna] Fraunhofer IMM, Nanoparticle Technol Dept, Carl Zeiss Str 18-20, D-55129 Mainz, Germany. | - |
local.description.affiliation | [Thoelen, Ronald] Hasselt Univ, Inst Mat Res, Martelarenlaan 42, B-3500 Hasselt, Belgium. | - |
item.fullcitation | FUHRMANN, Marc; KRIVCOV, Alexander; Musyanovych, Anna; THOELEN, Ronald & Moebius, Hildegard (2020) The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy. In: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 217 (13) (Art N° 1900828). | - |
item.fulltext | With Fulltext | - |
item.validation | ecoom 2021 | - |
item.contributor | FUHRMANN, Marc | - |
item.contributor | KRIVCOV, Alexander | - |
item.contributor | Musyanovych, Anna | - |
item.contributor | THOELEN, Ronald | - |
item.contributor | Moebius, Hildegard | - |
item.accessRights | Open Access | - |
crisitem.journal.issn | 1862-6300 | - |
crisitem.journal.eissn | 1862-6319 | - |
Appears in Collections: | Research publications |
WEB OF SCIENCETM
Citations
6
checked on Sep 20, 2024
Page view(s)
44
checked on Sep 6, 2022
Download(s)
12
checked on Sep 6, 2022
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.