Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/32766
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dc.contributor.authorDetriche, S.-
dc.contributor.authorVIVEGNIS, Sebastien-
dc.contributor.authorVanhumbeeck, J-F-
dc.contributor.authorFelten, A.-
dc.contributor.authorLouette, P.-
dc.contributor.authorRENNER, Frank-
dc.contributor.authorDelhalle, J.-
dc.contributor.authorMekhalif, Z.-
dc.date.accessioned2020-12-02T09:23:16Z-
dc.date.available2020-12-02T09:23:16Z-
dc.date.issued2020-
dc.date.submitted2020-11-12T11:25:45Z-
dc.identifier.citationJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 243 (Art N° 146970)-
dc.identifier.urihttp://hdl.handle.net/1942/32766-
dc.description.abstractThe thin oxide layers forming on the metal surfaces of metals determine their interactions with the environment and have a strong influence on the materials properties such as corrosion resistance. Such oxide layers typically have a thickness in the range of a few nanometres, which is a challenge for the analysis of their chemical nature and structure. To characterize such materials and surfaces, XPS using depth profile sputtering is a sensitive and powerful technique. However, it is rather elaborate and raises the risk of changing the nature of the surface layer during the analysis process. This work reports on a protocol for a faster approach to depth profile X-Ray photoelectron spectroscopy (XPS) analysis to obtain accurate and reproducible information on the oxide layer structure by using the snapshot mode of the XPS instrument. This protocol is applied to three stainless steels differing by their chemical composition: FeCr AISI 430, FeCrNi AISI 304 and the chemically more complex FeCrNiMo AISI 316. The respective oxide layer structures observed using this methodology are consistent with literature data. In addition, the structures have been confirmed using non-destructive techniques such as angle-resolved XPS (AR-XPS) and Hard XPS (HAXPES). Finally, the analysis protocol has been applied to obtain information on the evolution of the surface chemistry of those stainless steel grades resulting from mechanical polishing and subsequent aging in contact with atmosphere.-
dc.description.sponsorshipThe authors acknowledge SOLEIL for provision of synchrotron radiation facilities (proposal 20180830) and would like to thank D. Ceolin and J.-P. Rueff for assistance in using beamline "GALAXIES". The authors thanks the DGO6 for supporting this research in the field of AdEPT project (convention 1610449)-
dc.language.isoen-
dc.publisherELSEVIER-
dc.rights2020 Published by Elsevier B.V.-
dc.subject.otherXPS-
dc.subject.otherEvolution with time-
dc.subject.otherFast depth profile-
dc.subject.otherOxide layer structure-
dc.subject.otherStainless steel-
dc.subject.otherPolishing-
dc.titleXPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time-
dc.typeJournal Contribution-
dc.identifier.volume243-
local.format.pages13-
local.bibliographicCitation.jcatA1-
dc.description.notesDetriche, S (corresponding author), Univ Namur, Namur Inst Struct Matter NISM, Lab Chem & Electrochem Surfaces CES, Rue Bruxelles 61, B-5000 Namur, Belgium.-
dc.description.notessimon.detriche@unamur.be-
dc.description.otherDetriche, S (corresponding , author), Univ Namur, Namur Inst Struct Matter NISM, Lab Chem & Electrochem Surfaces CES, Rue Bruxelles 61, B-5000 Namur, Belgium. simon.detriche@unamur.be-
local.publisher.placeRADARWEG 29, 1043 NX AMSTERDAM, NETHERLANDS-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr146970-
dc.identifier.doi10.1016/j.elspec.2020.146970-
dc.identifier.isiWOS:000561359700002-
local.provider.typewosris-
local.uhasselt.uhpubyes-
local.description.affiliation[Detriche, S.; Vivegnis, S.; Delhalle, J.; Mekhalif, Z.] Univ Namur, Namur Inst Struct Matter NISM, Lab Chem & Electrochem Surfaces CES, Rue Bruxelles 61, B-5000 Namur, Belgium.-
local.description.affiliation[Felten, A.; Louette, P.] Univ Namur, Synth Irradiat & Anal Mat SIAM, Rue Bruxelles 61, B-5000 Namur, Belgium.-
local.description.affiliation[Vanhumbeeck, J-F] Ctr Rech Met CRM, Ave Bois St Jean 21,B27 Quartier Polytech 4, B-4000 Liege, Belgium.-
local.description.affiliation[Vivegnis, S.; Renner, F. U.] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Vivegnis, S.; Renner, F. U.] IMEC Vzw Div IMOMEC, B-3590 Diepenbeek, Belgium.-
item.fulltextWith Fulltext-
item.validationecoom 2021-
item.contributorRENNER, Frank-
item.contributorDelhalle, J.-
item.contributorVanhumbeeck, J-F-
item.contributorVIVEGNIS, Sebastien-
item.contributorMekhalif, Z.-
item.contributorDetriche, S.-
item.contributorLouette, P.-
item.contributorFelten, A.-
item.fullcitationDetriche, S.; VIVEGNIS, Sebastien; Vanhumbeeck, J-F; Felten, A.; Louette, P.; RENNER, Frank; Delhalle, J. & Mekhalif, Z. (2020) XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time. In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 243 (Art N° 146970).-
item.accessRightsRestricted Access-
crisitem.journal.issn0368-2048-
crisitem.journal.eissn1873-2526-
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