Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/33457
Full metadata record
DC FieldValueLanguage
dc.contributor.authorCurado, M. A.-
dc.contributor.authorTeixeira, J. P.-
dc.contributor.authorMONTEIRO, Margarida-
dc.contributor.authorRibeiro, E. F. M.-
dc.contributor.authorVilao, R. C.-
dc.contributor.authorAlberto, H. V.-
dc.contributor.authorCunha, J. M. V.-
dc.contributor.authorLOPES, Tomas-
dc.contributor.authorOliveira, K.-
dc.contributor.authorDonzel-Gargand, O.-
dc.contributor.authorHultqvist, A.-
dc.contributor.authorCalderon, S.-
dc.contributor.authorBarreiros, M. A.-
dc.contributor.authorChiappim, W.-
dc.contributor.authorLeitao, J. P.-
dc.contributor.authorSilva, A. G.-
dc.contributor.authorProkscha, T.-
dc.contributor.authorVinhais, C.-
dc.contributor.authorFernandes, P. A.-
dc.contributor.authorSalome, P. M. P.-
dc.date.accessioned2021-02-16T08:19:57Z-
dc.date.available2021-02-16T08:19:57Z-
dc.date.issued2020-
dc.date.submitted2021-02-02T14:06:13Z-
dc.identifier.citationApplied Materials Today, 21 (Art N° 100867)-
dc.identifier.urihttp://hdl.handle.net/1942/33457-
dc.description.abstractIn the past years, the strategies used to break the Cu(In,Ga)Se-2 (CIGS) light to power conversion efficiency world record value were based on improvements of the absorber optoelectronic and crystalline properties, mainly using complex post-deposition treatments. To reach even higher efficiency values, further advances in the solar cell architecture are needed, in particular, with respect to the CIGS interfaces. In this study, we evaluate the structural, morphological and optoelectronic impact of an Al2O3 layer as a potential front passivation layer on the CIGS properties, as well as an Al2O3 tunneling layer between CIGS and CdS. Morphological and structural analyses reveal that the use of Al2O3 alone is not detrimental to CIGS, although it does not resist to the CdS chemical bath deposition. The CIGS optoelectronic properties degrade when the CdS is deposited on top of Al2O3. Nonetheless, when Al2O3 is used alone, the optoelectronic measurements reveal a positive impact of this inclusion such as a very low concentration of interface defects while keeping the same CIGS recombination channels. Thus, we suggest that an Al2O3 front passivation layer can be successfully used with alternative buffer layers. Depth-resolved microscopic analysis of the CIGS interface with slow-muons strongly suggests for the first time that low-energy muon spin spectroscopy (LE-mu SR) is sensitive to both charge carrier separation and bulk recombination in complex semiconductors. The demonstration that Al2O3 has the potential to be used as a front passivation layer is of significant importance, considering that Al2O3 has been widely studied as rear interface passivation material. (C) 2020 Published by Elsevier Ltd.-
dc.description.sponsorshipThis work was supported in part by NovaCell (028075) and InovSolarCells (029696) and in part by FunrIa(do para a Ciencia c a Tecnologia and the ERDF through COMPETE2020. Fundacao para a Ciencia e a Tecnologia (FCT) is further acknowledged through 1F/00133/2015, PD/BD/142780/2018 and SFREHBD/1/1677G/2019. The European Union's Horizon 2020 research and innovation programme ARCIGS-M project (Grant agreement 720887) is also acknowledged. The financial support by National Funds through the FCT -Fundacao para a Ciencia e a Tecnologia, I.P., under the scope of the projects MB/50025/2020 and UIDP/50025/2020 -Programatico, are acknowledged. W. C. thanks the individual grant financed by the SusPhotoSolutions project CENTRO-01-0145-FEDER-000005. P. A. Fernandes would like to acknowledge FCT for the support of the project FCT UIDB/04730/2020. This work was supported with funds from FEDER (Programa Operacional Factores de Competitividade COMPETE) and from FCT [Fundacao para a Ciencia e Tecnologia (Portugal)] under Projects No. UID/FIS/04564/2016 and No. PTDC/FIS-MAC/29696/2017. The muon experiments were performed at the Swiss Muon Source SO, Paul Scherrer Institute, Villigen, Switzerland. The authors would like to thanks to Dr. Guy Brammertz for the helping in the interpretation of the TRPL data.-
dc.language.isoen-
dc.publisherELSEVIER-
dc.rightspublished article : 2020 Published by Elsevier Ltd. Accepted version : 2020. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/-
dc.subject.otherSurface passivation-
dc.subject.otherAl2O3-
dc.subject.otherCu(In-
dc.subject.otherGa)Se-2 (CIGS)-
dc.subject.otherThin film solar cells-
dc.subject.otherAtomic layer deposition (ALD)-
dc.titleFront passivation of Cu(In,Ga)Se2 solar cells using Al2O3: Culprits and benefits-
dc.typeJournal Contribution-
dc.identifier.volume21-
local.format.pages14-
local.bibliographicCitation.jcatA1-
dc.description.notesCurado, MA (corresponding author), INL, Int Iberian Nanotechnol Lab, P-4715330 Braga, Portugal.-
dc.description.notesmarco.alberto@inl.int-
dc.description.otherCurado, MA (corresponding author), INL, Int Iberian Nanotechnol Lab, P-4715330 Braga, Portugal. marco.alberto@inl.int-
local.publisher.placeRADARWEG 29, 1043 NX AMSTERDAM, NETHERLANDS-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr100867-
dc.identifier.doi10.1016/j.apmt.2020.100867-
dc.identifier.isiWOS:000599825600011-
dc.contributor.orcidFernandes, P. A./0000-0002-1860-7797; Leitao, Joaquim-
dc.contributor.orcidPratas/0000-0001-8131-3313; Barreiros, M. Alexandra/0000-0002-0132-4969;-
dc.contributor.orcidOliveira, Kevin/0000-0003-2697-8587; Chiappim Junior,-
dc.contributor.orcidWilliam/0000-0003-2615-2216-
local.provider.typewosris-
local.uhasselt.uhpubyes-
local.description.affiliation[Curado, M. A.; Teixeira, J. P.; Monteiro, M.; Cunha, J. M. V.; Lopes, T. S.; Oliveira, K.; Donzel-Gargand, O.; Calderon, S.; Vinhais, C.; Fernandes, P. A.; Salome, P. M. P.] INL, Int Iberian Nanotechnol Lab, P-4715330 Braga, Portugal.-
local.description.affiliation[Curado, M. A.; Ribeiro, E. F. M.; Vilao, R. C.; Alberto, H. V.] Univ Coimbra, CFisUC, Dept Phys, P-3004516 Coimbra, Portugal.-
local.description.affiliation[Monteiro, M.] Univ Nova Lisboa, Dept Fis, Fac Ciencias & Tecnol, Campus Caparica, P-2829516 Caparica, Portugal.-
local.description.affiliation[Cunha, J. M. V.; Chiappim, W.; Leitao, J. P.; Salome, P. M. P.] Univ Aveiro, Dept Fis, Campus Univ Santiago, P-3810193 Aveiro, Portugal.-
local.description.affiliation[Cunha, J. M. V.; Chiappim, W.; Leitao, J. P.; Fernandes, P. A.] Univ Aveiro, i3N, Campus Univ Santiago, P-3810193 Aveiro, Portugal.-
local.description.affiliation[Lopes, T. S.] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Lopes, T. S.] IMOMEC, Imec Div, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Lopes, T. S.] EnergyVille 2,Thor Pk 8320, B-3600 Genk, Belgium.-
local.description.affiliation[Donzel-Gargand, O.; Hultqvist, A.] Uppsala Univ, Dept Mat Sci & Engn, Solar Cell Technol, Box 534, SE-75121 Uppsala, Sweden.-
local.description.affiliation[Barreiros, M. A.] Lab Nacl Energia & Geol, Estr Paco Lumiar 22, Lisbon, Portugal.-
local.description.affiliation[Prokscha, T.] Paul Scherrer Inst, Lab Muon Spin Spect, CH-5232 Villigen, Switzerland.-
local.description.affiliation[Vinhais, C.; Fernandes, P. A.] Inst Politecn Porto, CIETI, Dept Fis, Inst Super Engn Porto, P-4200072 Porto, Portugal.-
local.uhasselt.internationalyes-
item.fullcitationCurado, M. A.; Teixeira, J. P.; MONTEIRO, Margarida; Ribeiro, E. F. M.; Vilao, R. C.; Alberto, H. V.; Cunha, J. M. V.; LOPES, Tomas; Oliveira, K.; Donzel-Gargand, O.; Hultqvist, A.; Calderon, S.; Barreiros, M. A.; Chiappim, W.; Leitao, J. P.; Silva, A. G.; Prokscha, T.; Vinhais, C.; Fernandes, P. A. & Salome, P. M. P. (2020) Front passivation of Cu(In,Ga)Se2 solar cells using Al2O3: Culprits and benefits. In: Applied Materials Today, 21 (Art N° 100867).-
item.fulltextWith Fulltext-
item.validationecoom 2022-
item.contributorCurado, M. A.-
item.contributorTeixeira, J. P.-
item.contributorMONTEIRO, Margarida-
item.contributorRibeiro, E. F. M.-
item.contributorVilao, R. C.-
item.contributorAlberto, H. V.-
item.contributorCunha, J. M. V.-
item.contributorLOPES, Tomas-
item.contributorOliveira, K.-
item.contributorDonzel-Gargand, O.-
item.contributorHultqvist, A.-
item.contributorCalderon, S.-
item.contributorBarreiros, M. A.-
item.contributorChiappim, W.-
item.contributorLeitao, J. P.-
item.contributorSilva, A. G.-
item.contributorProkscha, T.-
item.contributorVinhais, C.-
item.contributorFernandes, P. A.-
item.contributorSalome, P. M. P.-
item.accessRightsOpen Access-
crisitem.journal.issn2352-9407-
crisitem.journal.eissn2352-9407-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
Marco_Front_passivation_pre_print.pdfPeer-reviewed author version1.64 MBAdobe PDFView/Open
1-s2.0-S2352940720303152-main.pdf
  Restricted Access
Published version3.25 MBAdobe PDFView/Open    Request a copy
Show simple item record

WEB OF SCIENCETM
Citations

31
checked on Sep 28, 2024

Page view(s)

24
checked on Sep 5, 2022

Download(s)

14
checked on Sep 5, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.