Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3377
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dc.contributor.authorGregoris, G.-
dc.contributor.authorBouton, F.-
dc.contributor.authorDeKeukeleire, C.-
dc.contributor.authorSiliprandi, P.-
dc.contributor.authorBaio, F.-
dc.contributor.authorDE SCHEPPER, Luc-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorTielemans, L.-
dc.contributor.authorAhrens, T.-
dc.contributor.authorKrumm, M.-
dc.date.accessioned2007-11-28T08:26:45Z-
dc.date.available2007-11-28T08:26:45Z-
dc.date.issued1996-
dc.identifier.citationQUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 12(4). p. 247-252-
dc.identifier.issn0748-8017-
dc.identifier.urihttp://hdl.handle.net/1942/3377-
dc.description.abstractWe present the results of SHORTEST, a BRITE EURAM II project for the introduction in industry of an advanced approach to the reliability evaluation of electronic assemblies. The achievements so far are the development and validation of seven in-situ test techniques. Five of the test techniques demonstrate the capability of detecting failure mechanisms at 48 hours with moderate stress conditions, and half of the in-situ test results obtained at 48 hours on 10 subtechnologies correlate with conventional tests. All correlation results are presented. The application of the method for quality assurance and building-in reliability is discussed. The final aim of SHORTEST is to look for the exploitation of the developed in-situ techniques. The marketing study that will define the industrial needs of European companies is presented. In parallel, the insertion in the CECC specification of recommendations based on the SHORTEST principle is foreseen.-
dc.language.isoen-
dc.publisherJOHN WILEY & SONS LTD-
dc.subject.otherreliability; short duration test-
dc.titleEvaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques-
dc.typeJournal Contribution-
dc.identifier.epage252-
dc.identifier.issue4-
dc.identifier.spage247-
dc.identifier.volume12-
local.format.pages6-
dc.description.notesIBM CORP,EUROPEAN PACKAGING APPLICAT CTR,I-20059 VIMERCATE,ITALY. IMO LUC,B-3590 DIEPENBEEK,BELGIUM. DESTIN NV,B-3590 DIEPENBEEK,BELGIUM. UNIV BOURGOGNE,F-21004 DIJON,FRANCE. CEM,NEUMUNSTER,GERMANY.Gregoris, G, ALCATEL ESPACE,26 AV JF CHAMPOLL,BP 1187,F-31037 TOULOUSE,FRANCE.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.isiA1996VK02400006-
dc.identifier.urlhttp://www3.interscience.wiley.com/cgi-bin/abstract/20147/ABSTRACT-
item.contributorGregoris, G.-
item.contributorBouton, F.-
item.contributorDeKeukeleire, C.-
item.contributorSiliprandi, P.-
item.contributorBaio, F.-
item.contributorDE SCHEPPER, Luc-
item.contributorDE CEUNINCK, Ward-
item.contributorTielemans, L.-
item.contributorAhrens, T.-
item.contributorKrumm, M.-
item.accessRightsClosed Access-
item.fullcitationGregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T. & Krumm, M. (1996) Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques. In: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 12(4). p. 247-252.-
item.fulltextNo Fulltext-
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