Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/347
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dc.contributor.authorCROES, Kristof-
dc.contributor.authorMANCA, Jean-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorDE SCHEPPER, Luc-
dc.contributor.authorMOLENBERGHS, Geert-
dc.date.accessioned2004-10-25T07:20:38Z-
dc.date.available2004-10-25T07:20:38Z-
dc.date.issued1998-
dc.identifier.citationMicroelectronics and Reliability, 38(6-7). p. 1187-1191-
dc.identifier.issn0026-2714-
dc.identifier.urihttp://hdl.handle.net/1942/347-
dc.description.abstractEach statistical analysis of reliability data starts with the choice of the underlying distribution of failure times. This choice is of great importance because all conclusions drawn from this analysis will depend on it. Lifetime predictions can vary orders of magnitude depending on the distribution used. Most researchers choose the underlying distribution of failure times rather unfounded: because of "historical" reasons, because everybody uses it,… We developed a method which offers reliability engineers an objective tool for making the distinction between the two most widely used distributions, the lognormal and the Weibull, using a statistical well-founded technique. Essentially, the method comes down to constructing both the lognormal and the Weibull probability plot of the data set under consideration. For each plot, the Pearson's correlation coefficient is calculated. It is shown that the ratio of these two correlation coefficients is a pivotal quantity. Hence, it can serve as a test statistic.-
dc.description.sponsorshipOne of the authors (KC) would like to thank the Flemish Science Foundation IWT for financial support.-
dc.language.isoen-
dc.rights© 1998 Elsevier Science Ltd. All fights reserved.-
dc.subjectSurvival analysis-
dc.subjectMiscellaneous-
dc.titleThe time of 'guessing' your failure time distribution is over!-
dc.typeJournal Contribution-
dc.identifier.epage1191-
dc.identifier.issue6-7-
dc.identifier.spage1187-
dc.identifier.volume38-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0026-2714(98)00083-3-
dc.identifier.isi000076454300056-
item.fulltextWith Fulltext-
item.fullcitationCROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc & MOLENBERGHS, Geert (1998) The time of 'guessing' your failure time distribution is over!. In: Microelectronics and Reliability, 38(6-7). p. 1187-1191.-
item.contributorCROES, Kristof-
item.contributorMANCA, Jean-
item.contributorDE CEUNINCK, Ward-
item.contributorDE SCHEPPER, Luc-
item.contributorMOLENBERGHS, Geert-
item.validationecoom 1999-
item.accessRightsRestricted Access-
crisitem.journal.issn0026-2714-
crisitem.journal.eissn1872-941X-
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