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http://hdl.handle.net/1942/347Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | CROES, Kristof | - |
| dc.contributor.author | MANCA, Jean | - |
| dc.contributor.author | DE CEUNINCK, Ward | - |
| dc.contributor.author | DE SCHEPPER, Luc | - |
| dc.contributor.author | MOLENBERGHS, Geert | - |
| dc.date.accessioned | 2004-10-25T07:20:38Z | - |
| dc.date.available | 2004-10-25T07:20:38Z | - |
| dc.date.issued | 1998 | - |
| dc.identifier.citation | Microelectronics and Reliability, 38(6-7). p. 1187-1191 | - |
| dc.identifier.issn | 0026-2714 | - |
| dc.identifier.uri | http://hdl.handle.net/1942/347 | - |
| dc.description.abstract | Each statistical analysis of reliability data starts with the choice of the underlying distribution of failure times. This choice is of great importance because all conclusions drawn from this analysis will depend on it. Lifetime predictions can vary orders of magnitude depending on the distribution used. Most researchers choose the underlying distribution of failure times rather unfounded: because of "historical" reasons, because everybody uses it,… We developed a method which offers reliability engineers an objective tool for making the distinction between the two most widely used distributions, the lognormal and the Weibull, using a statistical well-founded technique. Essentially, the method comes down to constructing both the lognormal and the Weibull probability plot of the data set under consideration. For each plot, the Pearson's correlation coefficient is calculated. It is shown that the ratio of these two correlation coefficients is a pivotal quantity. Hence, it can serve as a test statistic. | - |
| dc.description.sponsorship | One of the authors (KC) would like to thank the Flemish Science Foundation IWT for financial support. | - |
| dc.language.iso | en | - |
| dc.rights | © 1998 Elsevier Science Ltd. All fights reserved. | - |
| dc.subject | Survival analysis | - |
| dc.subject | Miscellaneous | - |
| dc.title | The time of 'guessing' your failure time distribution is over! | - |
| dc.type | Journal Contribution | - |
| dc.identifier.epage | 1191 | - |
| dc.identifier.issue | 6-7 | - |
| dc.identifier.spage | 1187 | - |
| dc.identifier.volume | 38 | - |
| local.type.refereed | Refereed | - |
| local.type.specified | Article | - |
| dc.bibliographicCitation.oldjcat | A1 | - |
| dc.identifier.doi | 10.1016/S0026-2714(98)00083-3 | - |
| dc.identifier.isi | 000076454300056 | - |
| item.validation | ecoom 1999 | - |
| item.fullcitation | CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc & MOLENBERGHS, Geert (1998) The time of 'guessing' your failure time distribution is over!. In: Microelectronics and Reliability, 38(6-7). p. 1187-1191. | - |
| item.contributor | CROES, Kristof | - |
| item.contributor | MANCA, Jean | - |
| item.contributor | DE CEUNINCK, Ward | - |
| item.contributor | DE SCHEPPER, Luc | - |
| item.contributor | MOLENBERGHS, Geert | - |
| item.fulltext | With Fulltext | - |
| item.accessRights | Restricted Access | - |
| crisitem.journal.issn | 0026-2714 | - |
| crisitem.journal.eissn | 1872-941X | - |
| Appears in Collections: | Research publications | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Croes.pdf Restricted Access | Published version | 349.83 kB | Adobe PDF | View/Open Request a copy |
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