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http://hdl.handle.net/1942/3561
Title: | IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS | Authors: | MANCA, Jean DE SCHEPPER, Luc DE CEUNINCK, Ward D'OLIESLAEGER, Marc STALS, Lambert |
Issue Date: | 1995 | Publisher: | JOHN WILEY & SONS LTD | Source: | QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 11(4). p. 307-311 | Abstract: | By means of in situ e.m.f.-measurements, leakage current measurements and impedance spectroscopy, it has been possible for the first time to detect spontaneous and forced blistering in thick film multilayers during formation at high temperatures. Also the occurrence of high temperature shorts in Ag-dielectric-Ag multilayers under DC-bias was detectable. | Notes: | DESTIN NV,B-3590 DIEPENBEEK,BELGIUM.MANCA, J, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,WETENSCHAPSPK 1,B-3590 DIEPENBEEK,BELGIUM. | Keywords: | THICK FILM DIELECTRICS; IN SITU ELECTRICAL MEASUREMENTS; BLISTERING; SHORTING | Document URI: | http://hdl.handle.net/1942/3561 | DOI: | 10.1002/qre.4680110416 | ISI #: | A1995RR04700015 | Type: | Journal Contribution |
Appears in Collections: | Research publications |
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