IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3561

Title:	IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS
Authors:	MANCA, Jean DE SCHEPPER, Luc DE CEUNINCK, Ward D'OLIESLAEGER, Marc STALS, Lambert
Issue Date:	1995
Publisher:	JOHN WILEY & SONS LTD
Source:	QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 11(4). p. 307-311
Abstract:	By means of in situ e.m.f.-measurements, leakage current measurements and impedance spectroscopy, it has been possible for the first time to detect spontaneous and forced blistering in thick film multilayers during formation at high temperatures. Also the occurrence of high temperature shorts in Ag-dielectric-Ag multilayers under DC-bias was detectable.
Notes:	DESTIN NV,B-3590 DIEPENBEEK,BELGIUM.MANCA, J, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,WETENSCHAPSPK 1,B-3590 DIEPENBEEK,BELGIUM.
Keywords:	THICK FILM DIELECTRICS; IN SITU ELECTRICAL MEASUREMENTS; BLISTERING; SHORTING
Document URI:	http://hdl.handle.net/1942/3561
DOI:	10.1002/qre.4680110416
ISI #:	A1995RR04700015
Type:	Journal Contribution
Appears in Collections:	Research publications

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