Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/35914
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dc.contributor.authorKOHL, Thierry-
dc.contributor.authorDE WILD, Jessica-
dc.contributor.authorBRAMMERTZ, Guy-
dc.contributor.authorBuldu, D. G.-
dc.contributor.authorBIRANT, Gizem-
dc.contributor.authorvan der Vleuten, M.-
dc.contributor.authorSimor, M.-
dc.contributor.authorEachambadi, R. T.-
dc.contributor.authorMANCA, Jean-
dc.contributor.authorMEURIS, Marc-
dc.contributor.authorPOORTMANS, Jef-
dc.contributor.authorVERMANG, Bart-
dc.date.accessioned2021-11-26T14:40:50Z-
dc.date.available2021-11-26T14:40:50Z-
dc.date.issued2021-
dc.date.submitted2021-10-28T08:23:44Z-
dc.identifier.citationIEEE, p. 1179 -1181-
dc.identifier.isbn978-1-6654-1922-2-
dc.identifier.issn0160-8371-
dc.identifier.urihttp://hdl.handle.net/1942/35914-
dc.description.abstractIn modern Cu(In,Ga)Se2 (CIGS) solar cell production, alkali-poor substrates are becoming increasingly common. Thus, understanding the effect of alkali atoms on the growth of the CIGS absorber has become crucial. We studied this impact by comparing the bias dependent admittance spectroscopy response of CIGS solar cells grown with varying amounts of sodium using two different growth processes. The absence of sodium led to an intense response which is progressively replaced by other response domains as the sodium supply increases. We linked these new domains to Na accumulation and a resulting increase in band bending at the CIGS/CdS interface.-
dc.description.sponsorshipEuropean Union European Commission [715027]-
dc.language.isoen-
dc.publisherIEEE-
dc.subject.otheradmittance spectroscopy; thin film photovoltaics; CIGS; loss map; alkali-
dc.subject.otherdoping-
dc.titleBias dependent admittance spectroscopy: the impact of sodium supply on the Cu(In,Ga)Se2 growth-
dc.typeProceedings Paper-
local.bibliographicCitation.conferencedateJUN 20-25, 2021-
local.bibliographicCitation.conferencename48th IEEE Photovoltaic Specialists Conference (PVSC)-
local.bibliographicCitation.conferenceplaceELECTR NETWORK-
dc.identifier.epage1181-
dc.identifier.spage1179-
local.format.pages3-
local.bibliographicCitation.jcatC1-
dc.description.notesKohl, T (corresponding author), Hasselt Univ Partner Solliance, Inst Mat Res IMO, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.; Kohl, T (corresponding author), Imec Div IMOMEC Partner Solliance, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.; Kohl, T (corresponding author), EnergyVille, Thorpk,Poort Genk 8310 & 8320,3600, Genk, Belgium.-
local.publisher.place345 E 47TH ST, NEW YORK, NY 10017 USA-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
dc.identifier.doi10.1109/PVSC43889.2021.9518612-
dc.identifier.isiWOS:000701690400271-
local.provider.typewosris-
local.bibliographicCitation.btitle2021 IEEE 48TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)-
local.uhasselt.uhpubyes-
local.description.affiliation[Kohl, Thierry; de Wild, J.; Brammertz, G.; Buldu, D. G.; Birant, G.; Meuris, M.; Poortmans, J.; Vermang, B.] Hasselt Univ Partner Solliance, Inst Mat Res IMO, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Kohl, Thierry; de Wild, J.; Brammertz, G.; Buldu, D. G.; Birant, G.; Meuris, M.; Poortmans, J.; Vermang, B.] Imec Div IMOMEC Partner Solliance, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Kohl, Thierry; de Wild, J.; Brammertz, G.; Buldu, D. G.; Birant, G.; Meuris, M.; Poortmans, J.; Vermang, B.] EnergyVille, Thorpk,Poort Genk 8310 & 8320,3600, Genk, Belgium.-
local.description.affiliation[van der Vleuten, M.; Simor, M.] TNO Partner Solliance, High Tech Campus 21, NL-5656 AE Eindhoven, Netherlands.-
local.description.affiliation[van der Vleuten, M.; Simor, M.] Solliance Solar Res, High Tech Campus 21, NL-5656 AE Eindhoven, Netherlands.-
local.description.affiliation[Eachambadi, R. T.; Manca, J.] UHasselt X LAB, Agoralaan Gebouw D, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Poortmans, J.] Imec Partner Solliance, Kapeldreef 75, B-3001 Leuven, Belgium.-
local.description.affiliation[Poortmans, J.] Katholieke Univ Leuven, Dept Elect Engn, Kasteelpk Arenberg 10, B-3001 Heverlee, Belgium.-
local.uhasselt.internationalyes-
item.fulltextWith Fulltext-
item.contributorKOHL, Thierry-
item.contributorDE WILD, Jessica-
item.contributorBRAMMERTZ, Guy-
item.contributorBuldu, D. G.-
item.contributorBIRANT, Gizem-
item.contributorvan der Vleuten, M.-
item.contributorSimor, M.-
item.contributorEachambadi, R. T.-
item.contributorMANCA, Jean-
item.contributorMEURIS, Marc-
item.contributorPOORTMANS, Jef-
item.contributorVERMANG, Bart-
item.accessRightsRestricted Access-
item.validationecoom 2022-
item.fullcitationKOHL, Thierry; DE WILD, Jessica; BRAMMERTZ, Guy; Buldu, D. G.; BIRANT, Gizem; van der Vleuten, M.; Simor, M.; Eachambadi, R. T.; MANCA, Jean; MEURIS, Marc; POORTMANS, Jef & VERMANG, Bart (2021) Bias dependent admittance spectroscopy: the impact of sodium supply on the Cu(In,Ga)Se2 growth. In: IEEE, p. 1179 -1181.-
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