Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/36036
Title: Narrowband organic photodetectors – towards miniaturized, spectroscopic sensing
Authors: Wang, Jazhong
Kublitski, Jonas
Xing, Shen
Dollinger, Felix
SPOLTORE, Donato 
Benduhn, Johannes
Leo, Karl
Issue Date: 2022
Publisher: ROYAL SOC CHEMISTRY
Source: MATERIALS HORIZONS, 9 (1) , p. 220-251
Abstract: Omnipresent quality monitoring in food products, blood-oxygen measurement in lightweight conformal wrist bands, or data-driven automated industrial production: Innovation in many fields is being empowered by sensor technology. Specifically, organic photodetectors (OPDs) promise great advances due to their beneficial properties and low-cost production. Recent research has led to rapid improvement in all performance parameters of OPDs, which are now on-par or better than their inorganic counterparts, such as silicon or indium gallium arsenide photodetectors, in several aspects. In particular, it is possible to directly design OPDs for specific wavelengths. This makes expensive and bulky optical filters obsolete and allows for miniature detector devices. In this review, recent progress of such narrowband OPDs is systematically summarized covering all aspects from narrow-photo-absorbing materials to device architecture engineering. The recent challenges for narrowband OPDs, like achieving high responsivity, low dark current, high response speed, and good dynamic range are carefully addressed. Finally, application demonstrations covering broadband and narrowband OPDs are discussed. Importantly, several exciting research perspectives, which will stimulate further research on organic-semiconductor-based photodetectors, are pointed out at the very end of this review.
Notes: Benduhn, J; Leo, K (corresponding author), Tech Univ Dresden, Dresden Integrated Ctr Appl Phys & Photon Mat IAP, Nothnitzer Str 61, D-01187 Dresden, Germany.; Benduhn, J; Leo, K (corresponding author), Tech Univ Dresden, Inst Appl Phys, D-01187 Dresden, Germany.
johannes.benduhn@tu-dresden.de; karl.leo@tu-dresden.de
Keywords: Silicon;Spectrum Analysis;Gallium;Semiconductors
Document URI: http://hdl.handle.net/1942/36036
ISSN: 2051-6347
e-ISSN: 2051-6355
DOI: 10.1039/d1mh01215k
ISI #: 000711566200001
Rights: This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. Open Access Article. Published on 27 October 2021. Downloaded on 1/16/2024 11:37:01 AM. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence
Category: A1
Type: Journal Contribution
Validations: ecoom 2022
Appears in Collections:Research publications

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