Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/36060
Title: Detrimental Impact of Na Upon Rb Postdeposition Treatments of Cu(In,Ga)Se-2 Absorber Layers
Authors: DE WILD, Jessica 
BIRANT, Gizem 
THIRUVALLUR EACHAMBADI, Ragha 
KOHL, Thierry 
BULDU KOHL, Dilara 
BRAMMERTZ, Guy 
MANCA, Jean 
MEURIS, Marc 
POORTMANS, Jef 
VERMANG, Bart 
Issue Date: 2021
Publisher: WILEY-V C H VERLAG GMBH
Source: Solar RRL, 5 (9) (Art N° 2100390)
Abstract: Passivation of the Cu(In,Ga)Se-2 (CIGS)/Mo back contact using AlOx is studied to reduce the recombination at this interface. Herein, RbF postdeposition treatment (RbF-PDT), a well-established method to improve absorber and front interface properties is used on back-passivated solar cells. It is found that this combination deteriorates the performance due to formation of an injection barrier at the front and reduced acceptor concentration. Photoluminescence yield and decay times show no indication of increased defect recombination, as both are improved. With time-of- flight secondary ion mass spectroscopy, in-depth and lateral alkali profiles are measured. It is shown that the Na concentration is higher at the AlOx/ Mo back contact and that Rb accumulates at the CdS/CIGS interface. It is hypothesized that Na at the back is released during the RbF-PDT and inhibits Rb diffusion into the CIGS layer. Rb remains at the front and acceptor concentration is reduced. Modeling of dark and light current-voltage characteristics shows that the injection barrier and low doping are responsible for the reduced Voc and fill factor (FF). It is suggested that the commonly observed FF losses upon heavier alkali PDT can be eliminated by adapting the initial Na amount.
Keywords: alkali;Cu(In, Ga)Se-2;elemental mapping;injection barriers;luminescence mapping
Document URI: http://hdl.handle.net/1942/36060
ISSN: 2367-198X
e-ISSN: 2367-198X
DOI: 10.1002/solr.202100390
ISI #: 000673254000001
Rights: 2021 Wiley-VCH GmbH
Category: A1
Type: Journal Contribution
Validations: ecoom 2022
Appears in Collections:Research publications

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