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http://hdl.handle.net/1942/3609
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Stulens, Herwig | - |
dc.contributor.author | KNUYT, Gilbert | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | STALS, Lambert | - |
dc.date.accessioned | 2007-11-29T09:27:50Z | - |
dc.date.available | 2007-11-29T09:27:50Z | - |
dc.date.issued | 1994 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, 75(4). p. 2270-2277 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/1942/3609 | - |
dc.description.abstract | There are several reasons to believe that the microstructural changes in Al-Si interconnects has to be described in terms of a spectrum of activation energies rather than in terms of a single activation energy. In this article, a method is presented to extract a spectrum of activation energies from an isothermal and a constant heating rate experiment. The formalism was applied to the relaxation behavior of passivated Al-1%Si interconnects. The method of analysis shows that the microstructural relaxation mechanisms in these interconnects are characterized by a narrow spectrum, centered at an energy of about 1.2 eV. | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | An activation-energy study of the microstructural changes in al-1-percent-si interconnects | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 2277 | - |
dc.identifier.issue | 4 | - |
dc.identifier.spage | 2270 | - |
dc.identifier.volume | 75 | - |
local.format.pages | 8 | - |
dc.description.notes | STULENS, H, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,SCI PK,B-3590 DIEPENBEEK,BELGIUM. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1063/1.356291 | - |
dc.identifier.isi | A1994MX65400064 | - |
item.accessRights | Closed Access | - |
item.contributor | Stulens, Herwig | - |
item.contributor | KNUYT, Gilbert | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | STALS, Lambert | - |
item.fulltext | No Fulltext | - |
item.fullcitation | Stulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc & STALS, Lambert (1994) An activation-energy study of the microstructural changes in al-1-percent-si interconnects. In: JOURNAL OF APPLIED PHYSICS, 75(4). p. 2270-2277. | - |
Appears in Collections: | Research publications |
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