Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3647
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dc.contributor.authorKNUYT, Gilbert-
dc.contributor.authorStulens, Herwig-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-11-29T10:00:22Z-
dc.date.available2007-11-29T10:00:22Z-
dc.date.issued1993-
dc.identifier.citationMODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING, 1(4). p. 437-448-
dc.identifier.issn0965-0393-
dc.identifier.urihttp://hdl.handle.net/1942/3647-
dc.description.abstractWe present a method to calculate the activation energy spectrum (AES) for defect processes from isothermal data, based on a minimization principle (smoothest possible spectrum compatible with the experimental data). This principle leads to a matrix relation, from which the AES can be calculated in a very simple way, if the relevant functions are Fourier transformed. A window function suited to AES calculations is derived. The method is tested for simulated and experimental data. It appears to be rapid and flexible. In principle the number of input data can be made very large, leading to a sharp energy resolution.-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titleDerivation of an activation-energy spectrum for defect processes from isothermal measurements, using a minimization principle and Fourier-analysis-
dc.typeJournal Contribution-
dc.identifier.epage448-
dc.identifier.issue4-
dc.identifier.spage437-
dc.identifier.volume1-
local.format.pages12-
dc.description.notesKNUYT, G, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,UNIV CAMPUS,B-3590 DIEPENBEEK,BELGIUM.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.isiA1993MP24700008-
item.fulltextNo Fulltext-
item.contributorKNUYT, Gilbert-
item.contributorStulens, Herwig-
item.contributorDE CEUNINCK, Ward-
item.contributorSTALS, Lambert-
item.fullcitationKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward & STALS, Lambert (1993) Derivation of an activation-energy spectrum for defect processes from isothermal measurements, using a minimization principle and Fourier-analysis. In: MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING, 1(4). p. 437-448.-
item.accessRightsClosed Access-
Appears in Collections:Research publications
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