Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/37001
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dc.contributor.authorSingh, Sukhvinder-
dc.contributor.authorCHOULAT, Patrick-
dc.contributor.authorGOVAERTS, Jonathan-
dc.contributor.authorVAN DER HEIDE, Arvid-
dc.contributor.authorDEPAUW, Valerie-
dc.contributor.authorDUERINCKX, Filip-
dc.contributor.authorNaber, Ronald-
dc.contributor.authorLenes, Martijn-
dc.contributor.authorRenes, Marten-
dc.contributor.authorTOUS, Loic-
dc.contributor.authorPOORTMANS, Jef-
dc.date.accessioned2022-03-28T08:20:34Z-
dc.date.available2022-03-28T08:20:34Z-
dc.date.issued2022-
dc.date.submitted2022-03-17T15:03:57Z-
dc.identifier.citationProgress in Photovoltaics, 30 (8) , p. 899-909-
dc.identifier.urihttp://hdl.handle.net/1942/37001-
dc.description.abstractIn this work, we show the integration of polysilicon-based passivating contacts in plated bifacial n-type PERT (passivated emitter and rear totally diffused) solar cells. We show the viability of n-PERT cells using two-side passivating contacts with two-side plated nickel/silver metallization. Compared with commercially available "TOPCon" cells with rear side passivated contacts only, n-PERT cells with both side passivated contacts should enable the exploitation of the full potential of passivated contacts. We show that both n-poly and p-poly were applied and co-plated successfully on both sides of n-PERT solar cells. Considering the potential parasitic absorption losses on the front side of the device originating from p-poly, we applied selective p-poly by patterning. We compared two patterning methods for front side polysilicon: the masking and etch approach using inkjet printing and a simple and cost-effective patterning method using UV laser oxidation. A best efficiency of 22.7% has been achieved with these cells so far on large area (244.3 cm(2)) n-type Cz, with a potential efficiency above 24%. Some of these co-plated bifacial cells have been processed into one-cell laminates using smart wire interconnection (SWCT) technology. These have passed thermal cycling (TC) tests as defined in IEC61215.-
dc.description.sponsorshipRijksdienst voor Ondernemend Nederland, Grant/Award Number: TEUE118003 The authors gratefully acknowledge the funding by “Rijksdienst voor Ondernemend Nederland” under project no. TEUE118003.-
dc.language.isoen-
dc.publisherWILEY-
dc.rights2022 John Wiley & Sons, Ltd.-
dc.subject.othern-PERT-
dc.subject.otherPassivating contacts-
dc.subject.otherpatterned poly-Si-
dc.subject.otherTOPCon-
dc.titleLarge area co‐plated bifacial n‐PERT cells with polysilicon passivating contacts on both sides-
dc.typeJournal Contribution-
dc.identifier.epage909-
dc.identifier.issue8-
dc.identifier.spage899-
dc.identifier.volume30-
local.format.pages11-
local.bibliographicCitation.jcatA1-
dc.description.notesSingh, S (corresponding author), Imec Partner EnergyVille, Kapeldreef 75, B-3001 Leuven, Belgium.-
dc.description.notessukhvinder.singh@imec.be-
local.publisher.place111 RIVER ST, HOBOKEN 07030-5774, NJ USA-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1002/pip.3548-
dc.identifier.isiWOS:000761597700001-
local.provider.typewosris-
local.description.affiliation[Singh, Sukhvinder; Choulat, Patrick; Govaerts, Jonathan; van der Heide, Arvid; Depauw, Valerie; Duerinckx, Filip; Tous, Loic; Poortmans, Jef] Imec Partner EnergyVille, Kapeldreef 75, B-3001 Leuven, Belgium.-
local.description.affiliation[Naber, Ronald; Lenes, Martijn; Renes, Marten] Tempress, Vaassen, Netherlands.-
local.description.affiliation[Poortmans, Jef] UHasselt, Diepenbeek, Belgium.-
local.description.affiliation[Poortmans, Jef] Katholieke Univ Leuven, Dept Elect Engn, Leuven, Belgium.-
local.uhasselt.internationalyes-
item.fullcitationSingh, Sukhvinder; CHOULAT, Patrick; GOVAERTS, Jonathan; VAN DER HEIDE, Arvid; DEPAUW, Valerie; DUERINCKX, Filip; Naber, Ronald; Lenes, Martijn; Renes, Marten; TOUS, Loic & POORTMANS, Jef (2022) Large area co‐plated bifacial n‐PERT cells with polysilicon passivating contacts on both sides. In: Progress in Photovoltaics, 30 (8) , p. 899-909.-
item.accessRightsRestricted Access-
item.validationecoom 2023-
item.contributorSingh, Sukhvinder-
item.contributorCHOULAT, Patrick-
item.contributorGOVAERTS, Jonathan-
item.contributorVAN DER HEIDE, Arvid-
item.contributorDEPAUW, Valerie-
item.contributorDUERINCKX, Filip-
item.contributorNaber, Ronald-
item.contributorLenes, Martijn-
item.contributorRenes, Marten-
item.contributorTOUS, Loic-
item.contributorPOORTMANS, Jef-
item.fulltextWith Fulltext-
crisitem.journal.issn1062-7995-
crisitem.journal.eissn1099-159X-
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