Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3728
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dc.contributor.authorSCHAUER, F-
dc.contributor.authorBRADA, P-
dc.contributor.authorAdriaenssens, G.J.-
dc.contributor.authorNESLADEK, Milos-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-11-29T12:54:06Z-
dc.date.available2007-11-29T12:54:06Z-
dc.date.issued1993-
dc.identifier.citationJOURNAL OF NON-CRYSTALLINE SOLIDS, 166. p. 505-508-
dc.identifier.issn0022-3093-
dc.identifier.urihttp://hdl.handle.net/1942/3728-
dc.description.abstractThe influence of the progressive electric field relaxation on the transient photocurrent for intrinsic and B-doped a-Si:H samples is investigated. The photocurrent measurements are compared with the voltage sweep-out experiments and with mathematical simulations of the photocurrent obtained from the numerical solution of the multiple trapping model. Beyond the dielectric relaxation a current due to the charge release from deep traps is identified.-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.titleElectric-field relaxation in prolonged-time photocurrent experiments-
dc.typeJournal Contribution-
dc.identifier.epage508-
dc.identifier.spage505-
dc.identifier.volume166-
local.format.pages4-
dc.description.notesTECH ACAD BRNO,DEPT PHYS,CS-60200 BRNO,CZECH REPUBLIC.NESLADEK, M, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,CAMPUSLAAN,B-3590 DIEPENBEEK,BELGIUM.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.isiA1993MT01200123-
item.fulltextNo Fulltext-
item.accessRightsClosed Access-
item.fullcitationSCHAUER, F; BRADA, P; Adriaenssens, G.J.; NESLADEK, Milos & STALS, Lambert (1993) Electric-field relaxation in prolonged-time photocurrent experiments. In: JOURNAL OF NON-CRYSTALLINE SOLIDS, 166. p. 505-508.-
item.contributorSCHAUER, F-
item.contributorBRADA, P-
item.contributorAdriaenssens, G.J.-
item.contributorNESLADEK, Milos-
item.contributorSTALS, Lambert-
Appears in Collections:Research publications
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