Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/37417
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dc.contributor.authorBREUGELMANS, Robbe-
dc.contributor.authorCAROLUS, Jorne-
dc.contributor.authorVAN DER HEIDE, Arvid-
dc.contributor.authorVoroshazi, Eszter-
dc.contributor.authorDAENEN, Michael-
dc.date.accessioned2022-06-02T10:26:37Z-
dc.date.available2022-06-02T10:26:37Z-
dc.date.issued2020-
dc.date.submitted2022-05-15T11:11:31Z-
dc.identifier.citation37th European Photovoltaic Solar Energy Conference and Exhibition, Lissabon, Portugal, 7/09/2020-11/09/2020-
dc.identifier.isbn3936338736-
dc.identifier.urihttp://hdl.handle.net/1942/37417-
dc.description.abstractPotential-induced degradation rapidly and significantly affects the photovoltaic (PV) module's performance due to a high potential difference across the PV cell and the grounded module's frame.[1] PID has various types where PID of the shunting type (PID-s) is common within silicon PV cells.[2] Extensive research already points towards sodium (Na) ions as the root cause of the efficiency degradation under PID-s.[3] However, the origin of the Na ions is still under debate. Some publications state that the soda-lime glass (SLG) cover of the PV module is the main source of the Na ions. In contrast, others have proven to degrade solar cells in the absence of an encapsulation material and front cover glass. [3-6] With this work, we try to find an answer to the current debate and thus find the source of the Na ions causing PID-s.-
dc.language.isoen-
dc.publisherEUPVSEC-
dc.subject.otherPotential-induced degradation-
dc.subject.otherOrigin sodium ions-
dc.subject.otherSilicon solar cells-
dc.subject.otherPhotovoltaics-
dc.titlePotential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt Paths-
dc.typeConference Material-
local.bibliographicCitation.conferencedate7/09/2020-11/09/2020-
local.bibliographicCitation.conferencename37th European Photovoltaic Solar Energy Conference and Exhibition-
local.bibliographicCitation.conferenceplaceLissabon, Portugal-
local.bibliographicCitation.jcatC2-
local.publisher.placehttps://www.eupvsec-proceedings.com/-
dc.relation.references[1] S. Pingel, O. Frank, M. Winkler, S. Oaryan, T. Geipel, H. Hoehne, and J. Berghold, “Potential induced degradation of solar cells and panels,” in Conference Record of the IEEE Photovoltaic Specialists Conference, 2010, pp. 2817–2822, doi: 10.1109/PVSC.2010.5616823. [2] V. Naumann, D. Lausch, A. Hähnel, J. Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Großer, J. Bagdahn, and C. Hagendorf, “Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells,” Sol. Energy Mater. Sol. Cells, 2014, doi: 10.1016/j.solmat.2013.06.015. [3] W. Luo, Y. S. Khoo, P. Hacke, V. Naumann, D. Lausch, S. P. Harvey, J. P. Singh, J. Chai, Y. Wang, A. G. Aberle, and S. Ramakrishna, “Potential-induced degradation in photovoltaic modules: A critical review,” Energy and Environmental Science, vol. 10, no. 1. Royal Society of Chemistry, pp. 43–68, Jan. 01, 2017, doi: 10.1039/c6ee02271e. [4] P. Hacke, R. Smith, K. Terwilliger, S. Glick, D. Jordan, S. Johnston, M. Kempe, and S. Kurtz, “Acceleration factor determination for potential-induced degradation in crystalline silicon PV modules,” 2013, doi: 10.1109/IRPS.2013.6532009. [5] V. Naumann, D. Lausch, and C. Hagendorf, “Sodium Decoration of PID-s Crystal Defects after Corona Induced Degradation of Bare Silicon Solar Cells,” in Energy Procedia, 2015, vol. 77, pp. 397–401, doi: 10.1016/j.egypro.2015.07.055. [6] S. Jonai and A. Masuda, “Origin of Na causing potential-induced degradation for p-type crystalline Si photovoltaic modules,” AIP Adv., vol. 8, no. 11, Nov. 2018, doi: 10.1063/1.5040516-
local.type.refereedRefereed-
local.type.specifiedConference Poster-
dc.identifier.urlhttps://www.eupvsec-proceedings.com/proceedings?paper=49386-
local.provider.typePdf-
local.uhasselt.internationalno-
item.fulltextWith Fulltext-
item.accessRightsOpen Access-
item.fullcitationBREUGELMANS, Robbe; CAROLUS, Jorne; VAN DER HEIDE, Arvid; Voroshazi, Eszter & DAENEN, Michael (2020) Potential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt Paths. In: 37th European Photovoltaic Solar Energy Conference and Exhibition, Lissabon, Portugal, 7/09/2020-11/09/2020.-
item.contributorBREUGELMANS, Robbe-
item.contributorCAROLUS, Jorne-
item.contributorVAN DER HEIDE, Arvid-
item.contributorVoroshazi, Eszter-
item.contributorDAENEN, Michael-
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