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http://hdl.handle.net/1942/39134
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DC Field | Value | Language |
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dc.contributor.author | VAN DYCK, Rik | - |
dc.contributor.author | Prapavesis, Alexandros | - |
dc.contributor.author | BORGERS, Tom | - |
dc.contributor.author | GOVAERTS, Jonathan | - |
dc.contributor.author | POORTMANS, Jef | - |
dc.contributor.author | van Vuure, Aart W. | - |
dc.date.accessioned | 2023-01-04T08:33:10Z | - |
dc.date.available | 2023-01-04T08:33:10Z | - |
dc.date.issued | 2023 | - |
dc.date.submitted | 2023-01-03T12:28:36Z | - |
dc.identifier.citation | SOLAR ENERGY MATERIALS AND SOLAR CELLS, 250 (Art N° 112100) | - |
dc.identifier.uri | http://hdl.handle.net/1942/39134 | - |
dc.description.abstract | X-ray (micro-)computed tomography is a non-destructive characterization method using photons to obtain multiple radiographic projections, which generates a 3D volume rendering of a scanned object after reconstruction. It is recently used in the research and development of photovoltaic modules to investigate smaller volumes in a PV module, for example, detection of cavities in solder joints and visualization of module volumes up to connection ribbon sizes. This work shows that current advanced devices are able to scan larger volumes, using a single-cell 20 x 20 x 0.5 cm(3) module with back-contact multi-ribbon interconnection technology as an example. The generated 3D volume renderings show the interconnection structures and give information on ribbon-metallization interconnections. Next to this, also the solder reflow volume is visible, indicating that the technology has great potential to be used in further interconnection technology development. Finally, a destructive cross section analysis using scanning electron microscopy is performed; it has a higher resolution and can differentiate elements with similar photon absorption coefficients, thus enabling microstructure and intermetallic compound analysis. The findings show the potential for micro-computed tomography as a nondestructive and relatively fast visualization method and how it can give complementary information to other characterization techniques for photovoltaic interconnection research. | - |
dc.description.sponsorship | The authors gratefully acknowledge imec’s SiPV industrial affiliation programme and its partners, Fonds Wetenschappelijk Onderzoek, through the SB Ph.D. Fellowship under grant number 1S14120 N, and their large infrastructure I013518 N project for the financial support of the X-ray infrastructure at the KU Leuven. The KU Leuven XCT Core facility is acknowledged for the 3D image acquisition and quantitative post-processing tools (https://xct.kuleuven.be/), and ISC Konstanz for providing the ZEBRA IBC solar cells. | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.rights | 2022 Elsevier B.V. All rights reserved. | - |
dc.subject.other | PV Module characterization | - |
dc.subject.other | Micro-computed tomography | - |
dc.subject.other | Scanning electron microscopy | - |
dc.subject.other | Solder joints | - |
dc.title | Assessment of 3D micro-computed tomography for PV interconnection technology development | - |
dc.type | Journal Contribution | - |
dc.identifier.volume | 250 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Van Dyck, R (corresponding author), IMEC, Imo Imomec, Thor Pk 8320, B-3600 Genk, Belgium. | - |
dc.description.notes | rik.vandyck@imec.be | - |
local.publisher.place | RADARWEG 29, 1043 NX AMSTERDAM, NETHERLANDS | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
local.bibliographicCitation.artnr | 112100 | - |
dc.identifier.doi | 10.1016/j.solmat.2022.112100 | - |
dc.identifier.isi | 000890906100006 | - |
local.provider.type | wosris | - |
local.description.affiliation | [Van Dyck, Rik; Prapavesis, Alexandros; van Vuure, Aart W.] Katholieke Univ Leuven, Dept Mat Engn, Kasteelpk Arenberg 10, B-3001 Leuven, Belgium. | - |
local.description.affiliation | [Van Dyck, Rik; Borgers, Tom; Govaerts, Jonathan; Poortmans, Jef] Hasselt Univ, Imo Imomec, Martelarenlaan 42, B-3500 Hasselt, Belgium. | - |
local.description.affiliation | [Van Dyck, Rik; Borgers, Tom; Govaerts, Jonathan; Poortmans, Jef] IMEC, Imo Imomec, Thor Pk 8320, B-3600 Genk, Belgium. | - |
local.description.affiliation | [Van Dyck, Rik; Borgers, Tom; Govaerts, Jonathan; Poortmans, Jef] Energy Ville, Imo Imomec, Thor Pk 8320, B-3600 Genk, Belgium. | - |
local.description.affiliation | [Poortmans, Jef] Katholieke Univ Leuven, Dept Elect Engn, Kasteelpk Arenberg 44, B-3001 Leuven, Belgium. | - |
local.uhasselt.international | no | - |
item.contributor | VAN DYCK, Rik | - |
item.contributor | Prapavesis, Alexandros | - |
item.contributor | BORGERS, Tom | - |
item.contributor | GOVAERTS, Jonathan | - |
item.contributor | POORTMANS, Jef | - |
item.contributor | van Vuure, Aart W. | - |
item.fullcitation | VAN DYCK, Rik; Prapavesis, Alexandros; BORGERS, Tom; GOVAERTS, Jonathan; POORTMANS, Jef & van Vuure, Aart W. (2023) Assessment of 3D micro-computed tomography for PV interconnection technology development. In: SOLAR ENERGY MATERIALS AND SOLAR CELLS, 250 (Art N° 112100). | - |
item.accessRights | Embargoed Access | - |
item.fulltext | With Fulltext | - |
item.embargoEndDate | 2025-01-15 | - |
crisitem.journal.issn | 0927-0248 | - |
crisitem.journal.eissn | 1879-3398 | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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Assessment of 3D micro-computed tomography for PV interconnection technology development.pdf Restricted Access | Published version | 4.71 MB | Adobe PDF | View/Open Request a copy |
accepted version SOLMAT (1).pdf Until 2025-01-15 | Peer-reviewed author version | 1.45 MB | Adobe PDF | View/Open Request a copy |
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