Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/39288
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dc.contributor.authorALAVI, Omid-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorDAENEN, Michael-
dc.date.accessioned2023-01-23T12:56:34Z-
dc.date.available2023-01-23T12:56:34Z-
dc.date.issued2022-
dc.date.submitted2023-01-12T15:07:12Z-
dc.identifier.citationMICROELECTRONICS RELIABILITY, 138 (Art N° 114736)-
dc.identifier.urihttp://hdl.handle.net/1942/39288-
dc.description.abstractThis paper examines the impact of various packaging materials on the IGBT module's thermal characteristics. A 3D finite element method (FEM) model of the studied IGBT module is created and validated by experimental tests. The materials used in the baseplate and the insulation layer of the IGBT module are then replaced with various materials to investigate how different material combinations affect the thermal performance. The ob-tained thermal performance of different materials is placed next to other criteria (mechanical strengths, least square of CTE mismatches, cost, and weight) to be ranked by the TOPSIS multi-criteria decision-making method based on the given objective weights. The results showed that the three combinations of AlSiC/AlN, W/Si3N4 and AlSiC/Si3N4 have the best overall performance and are ranked first to third, respectively. The frequently used material pair Cu/Al2O3 achieved 14th place indicating that it performs poorly in comparison to the other alternatives.-
dc.description.sponsorshipThis work is (partially) supported by the energy transition funds project “BREGILAB” organized by the FPS economy, S.M.E.s, Selfemployed and Energy (Met de steun van het Energietransitiefonds)-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.rights2022 Elsevier Ltd. All rights reserved.-
dc.subject.otherTOPSIS-
dc.subject.otherReliability of power electronics-
dc.subject.otherIGBT module-
dc.subject.otherFinite element method-
dc.subject.otherThermal model-
dc.titleOptimized selection of materials for IGBT module packaging-
dc.typeJournal Contribution-
dc.identifier.volume138-
local.bibliographicCitation.jcatA1-
dc.description.notesAlavi, O (corresponding author), Hasselt Univ, IMO IMOMEC, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
dc.description.notesomid.alavi@uhasselt.be-
local.publisher.placeTHE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr114736-
dc.identifier.doi10.1016/j.microrel.2022.114736-
dc.identifier.isi000897681400003-
local.provider.typewosris-
local.description.affiliation[Alavi, O.] Hasselt Univ, IMO IMOMEC, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.-
local.description.affiliationImec, Kapeldreef 75, B-3001 Heverlee, Belgium.-
local.description.affiliationEnergyVille, Thor Pk 8320, B-3600 Genk, Belgium.-
local.uhasselt.internationalno-
item.validationecoom 2024-
item.contributorALAVI, Omid-
item.contributorDE CEUNINCK, Ward-
item.contributorDAENEN, Michael-
item.fullcitationALAVI, Omid; DE CEUNINCK, Ward & DAENEN, Michael (2022) Optimized selection of materials for IGBT module packaging. In: MICROELECTRONICS RELIABILITY, 138 (Art N° 114736).-
item.fulltextWith Fulltext-
item.accessRightsOpen Access-
crisitem.journal.issn0026-2714-
crisitem.journal.eissn1872-941X-
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