Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/40413
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dc.contributor.authorRavyts, S-
dc.contributor.authorVAN DE SANDE, Wieland-
dc.contributor.authorDAENEN, Michael-
dc.contributor.authorDriesen, J-
dc.contributor.authorCappelle, J-
dc.date.accessioned2023-06-15T10:34:03Z-
dc.date.available2023-06-15T10:34:03Z-
dc.date.issued2021-
dc.date.submitted2023-06-13T07:07:18Z-
dc.identifier.citation2021 23RD EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'21 ECCE EUROPE), IEEE, (Art N° 21380856)-
dc.identifier.isbn9789075815375-
dc.identifier.issn2325-0313-
dc.identifier.urihttp://hdl.handle.net/1942/40413-
dc.description.abstractIn this paper, the impact of control on lifetime and efficiency will be investigated for the case of an interleaved boost converter. Firstly, the influence of the conduction mode on losses and start-up current will be discussed. Secondly, two possible phase shedding strategies will be discussed and compared to the case where all phases are continuously on. A new temperature based phase shedding scheme is introduced for applications where high temperatures occur, such as in BIPV applications. Six different combinations of conduction mode and phase shedding strategy are combined in a simulation framework. The cases are evaluated on efficiency and lifetime using one-year experimental data of a BIPV test building.-
dc.language.isoen-
dc.publisherIEEE-
dc.relation.ispartofseriesEuropean Conference on Power Electronics and Applications-
dc.subject.otherPhotovoltaic-
dc.subject.otherReliability-
dc.subject.otherDC-DC converter-
dc.titleImpact of Conduction Mode and Phase-Shedding Strategy on Transistor Lifetime in Building-Integrated Photovoltaics Module-Level Converters-
dc.typeProceedings Paper-
local.bibliographicCitation.conferencedateSeptember 06-10, 2021-
local.bibliographicCitation.conferencename23rd European Conference on Power Electronics and Applications (EPE ECCE Europe)-
local.bibliographicCitation.conferenceplacevirtual-
local.format.pages10-
local.bibliographicCitation.jcatC1-
local.publisher.place345 E 47TH ST, NEW YORK, NY 10017 USA-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
local.bibliographicCitation.artnr21380856-
dc.identifier.doi10.23919/EPE21ECCEEurope50061.2021.9570524-
dc.identifier.isi000832143901029-
local.provider.typeWeb of Science-
local.bibliographicCitation.btitle2021 23RD EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'21 ECCE EUROPE)-
local.uhasselt.internationalno-
item.fullcitationRavyts, S; VAN DE SANDE, Wieland; DAENEN, Michael; Driesen, J & Cappelle, J (2021) Impact of Conduction Mode and Phase-Shedding Strategy on Transistor Lifetime in Building-Integrated Photovoltaics Module-Level Converters. In: 2021 23RD EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'21 ECCE EUROPE), IEEE, (Art N° 21380856).-
item.fulltextWith Fulltext-
item.validationecoom 2023-
item.contributorRavyts, S-
item.contributorVAN DE SANDE, Wieland-
item.contributorDAENEN, Michael-
item.contributorDriesen, J-
item.contributorCappelle, J-
item.accessRightsRestricted Access-
Appears in Collections:Research publications
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