Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/40814
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dc.contributor.authorChen, Bin-
dc.contributor.authorZhai, Zhaofeng-
dc.contributor.authorHuang, Nan-
dc.contributor.authorZhang, Chuyan-
dc.contributor.authorYu, Siyu-
dc.contributor.authorLiu, Lusheng-
dc.contributor.authorYang, Bing-
dc.contributor.authorJiang, Xin-
dc.contributor.authorYANG, Nianjun-
dc.date.accessioned2023-08-31T10:01:19Z-
dc.date.available2023-08-31T10:01:19Z-
dc.date.issued2023-
dc.date.submitted2023-08-31T09:58:33Z-
dc.identifier.citationAdvanced Energy Materials, 13 (36), (Art N° 2300716)-
dc.identifier.issn1614-6832-
dc.identifier.urihttp://hdl.handle.net/1942/40814-
dc.description.abstractA confined electrical double-layer (EDL) inside nanoporous electrodes has a large capacitance and deviates from traditional ones. Unfortunately, its capacitive mechanism is still unclear. Herein, expanded vertical graphene/diamond (EVG/D) films with regular and ordered 0.7-nm layered channels are designed and synthesized to serve as an ideal model for understanding confined EDL. A clear overall picture of confined EDL is provided at an atomic resolution with the aid of in situ electrochemical Raman spectroscopy, electrochemical quartz crystal microbalance (EQCM), and density functional theory (DFT) calculations combined with three-dimension reference interaction site method (3D-RISM). It is especially interesting that the induced charges in electrode hosts are highly localized with a density far higher than that on a traditional EDL and even close to those of ion batteries. It is proposed that such a high localization of induced charges plays an essential role in the high energy storage efficiency of confined EDL capacitance. This work not only provides a previously unexplored way to refine the mechanism of confined EDL, but also further lays the foundation for understanding the functions of nanoporous or layered materials in electrochemical energy storage.-
dc.description.sponsorshipThe authors thank for Prof. Zhongshuai Wu in Dalian Institute of Chemical Physics, Chinese Academy of Sciences and Prof. Bingsen Zhang in Institute of Metal Research, Chinese Academy of Sciences for the discussion of the electrical double-layer capacitance. This work was supported by the National Natural Science Foundation of China (No. 51202257) and N. Y. thanks the financial support from Deutsche Forschungsgemeinschaft (DFG, German Research Foundation, No. 457444676).-
dc.language.isoen-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.rights2023 Wiley-VCH GmbH-
dc.subject.otherconfined electrical double layers-
dc.subject.otherexpanded vertical graphene-
dc.subject.otherin situ electrochemical Raman-
dc.subject.otherlocalized charge-
dc.subject.otherexpanded vertical diamond-
dc.titleHighly Localized Charges of Confined Electrical Double-Layers Inside 0.7-nm Layered Channels-
dc.typeJournal Contribution-
dc.identifier.issue36-
dc.identifier.volume13-
local.bibliographicCitation.jcatA1-
dc.description.notesHuang, N; Jiang, X (corresponding author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.; Huang, N (corresponding author), Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China.; Jiang, X (corresponding author), Univ Siegen, Inst Mat Engn, D-57076 Siegen, Germany.; Yang, NJ (corresponding author), Hasselt Univ, Dept Chem, B-3590 Diepenbeek, Belgium.; Yang, NJ (corresponding author), Hasselt Univ, IMO IMOMEC, B-3590 Diepenbeek, Belgium.-
dc.description.notesnhuang@imr.ac.cn; xjiang@imr.ac.cn; nianjun.yang@uhasselt.be-
local.publisher.placePOSTFACH 101161, 69451 WEINHEIM, GERMANY-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr2300716-
dc.identifier.doi10.1002/aenm.202300716-
dc.identifier.isi001044772400001-
dc.identifier.eissn1614-6840-
local.provider.typeWeb of Science-
local.description.affiliation[Chen, Bin; Zhai, Zhaofeng; Huang, Nan; Zhang, Chuyan; Liu, Lusheng; Yang, Bing; Jiang, Xin] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China.-
local.description.affiliation[Chen, Bin; Huang, Nan; Yang, Bing] Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China.-
local.description.affiliation[Zhang, Chuyan; Jiang, Xin] Univ Siegen, Inst Mat Engn, D-57076 Siegen, Germany.-
local.description.affiliation[Yu, Siyu] Southwest Univ, Sch Chem & Chem Engn, Chongqing 400715, Peoples R China.-
local.description.affiliation[Yang, Nianjun] Hasselt Univ, Dept Chem, B-3590 Diepenbeek, Belgium.-
local.description.affiliation[Yang, Nianjun] Hasselt Univ, IMO IMOMEC, B-3590 Diepenbeek, Belgium.-
local.uhasselt.internationalyes-
item.accessRightsEmbargoed Access-
item.fullcitationChen, Bin; Zhai, Zhaofeng; Huang, Nan; Zhang, Chuyan; Yu, Siyu; Liu, Lusheng; Yang, Bing; Jiang, Xin & YANG, Nianjun (2023) Highly Localized Charges of Confined Electrical Double-Layers Inside 0.7-nm Layered Channels. In: Advanced Energy Materials, 13 (36), (Art N° 2300716).-
item.fulltextWith Fulltext-
item.embargoEndDate2024-10-01-
item.contributorChen, Bin-
item.contributorZhai, Zhaofeng-
item.contributorHuang, Nan-
item.contributorZhang, Chuyan-
item.contributorYu, Siyu-
item.contributorLiu, Lusheng-
item.contributorYang, Bing-
item.contributorJiang, Xin-
item.contributorYANG, Nianjun-
crisitem.journal.issn1614-6832-
crisitem.journal.eissn1614-6840-
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