Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/4148
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Volodin, A. | - |
dc.contributor.author | Toma, C. | - |
dc.contributor.author | BOGDAN, Anna | - |
dc.contributor.author | DEFERME, Wim | - |
dc.contributor.author | HAENEN, Ken | - |
dc.contributor.author | NESLADEK, Milos | - |
dc.contributor.author | Van Haesendonck, C. | - |
dc.date.accessioned | 2007-12-11T08:54:28Z | - |
dc.date.available | 2007-12-11T08:54:28Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, 91(14). p. 142111-... | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/1942/4148 | - |
dc.description.abstract | A method for mapping the surface conductivity of hydrogen-terminated (H-terminated) diamond on a sub-100 nm scale is presented. The measuring technique relies on electrostatic force microscopy imaging of the voltage distribution of a current-carrying H-terminated diamond film. The uniform linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as homogeneous, diffusive conductors with a well-defined value of the sheet resistance. On the other hand, we observe conductive as well as insulating regions that coexist for not perfectly H-terminated diamond surfaces with poor electric conductivity. () 2007 American Institute of Physics. (C) 2007 American Institute of Physics. | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films | - |
dc.type | Journal Contribution | - |
dc.identifier.issue | 14 | - |
dc.identifier.spage | 142111 | - |
dc.identifier.volume | 91 | - |
local.format.pages | 3 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, BE-3001 Louvain, Belgium. Hasselt Univ, Mat Res Inst, BE-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, BE-3590 Diepenbeek, Belgium.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, BE-3001 Louvain, Belgium.alexander.volodin@fys.kuleuven.be | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1063/1.2795342 | - |
dc.identifier.isi | 000249974100057 | - |
item.accessRights | Closed Access | - |
item.fullcitation | Volodin, A.; Toma, C.; BOGDAN, Anna; DEFERME, Wim; HAENEN, Ken; NESLADEK, Milos & Van Haesendonck, C. (2007) Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films. In: APPLIED PHYSICS LETTERS, 91(14). p. 142111-.... | - |
item.contributor | Volodin, A. | - |
item.contributor | Toma, C. | - |
item.contributor | BOGDAN, Anna | - |
item.contributor | DEFERME, Wim | - |
item.contributor | HAENEN, Ken | - |
item.contributor | NESLADEK, Milos | - |
item.contributor | Van Haesendonck, C. | - |
item.fulltext | No Fulltext | - |
item.validation | ecoom 2008 | - |
crisitem.journal.issn | 0003-6951 | - |
crisitem.journal.eissn | 1077-3118 | - |
Appears in Collections: | Research publications |
SCOPUSTM
Citations
2
checked on Sep 3, 2020
WEB OF SCIENCETM
Citations
2
checked on Apr 22, 2024
Page view(s)
50
checked on Sep 7, 2022
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.