Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4165
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dc.contributor.authorKirsch, Philippe-
dc.contributor.authorAssouar, Mohamed B.-
dc.contributor.authorElmazria, O.-
dc.contributor.authorEl Hakiki, M.-
dc.contributor.authorMORTET, Vincent-
dc.contributor.authorAlnot, Patrick-
dc.date.accessioned2007-12-11T09:25:21Z-
dc.date.available2007-12-11T09:25:21Z-
dc.date.issued2007-
dc.identifier.citationIEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 54(7). p. 1486-1491-
dc.identifier.issn0885-3010-
dc.identifier.urihttp://hdl.handle.net/1942/4165-
dc.description.abstractIn this work, we report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDTs) made of aluminium with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDTs were confirmed by field emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AIN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K-2), the AIN layer thickness was chosen in order to combine high velocity and high K-2. Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleCombination of e-beam lithography and of high velocity AlN/diamond-layered structure for SAW filters in X band-
dc.typeJournal Contribution-
dc.identifier.epage1491-
dc.identifier.issue7-
dc.identifier.spage1486-
dc.identifier.volume54-
local.format.pages6-
local.bibliographicCitation.jcatA1-
dc.description.notesNancy Univ, LPMIA, Lab Phys Milieux Ionises & Applicat, CNRS, Nancy, France. Limburgs Univ Ctr, Inst Mat Res, B-3590 Diepenbeek, Belgium.Kirsch, P, Nancy Univ, LPMIA, Lab Phys Milieux Ionises & Applicat, CNRS, Nancy, France.badreddine.assouar@lpmi.uhp-nancy.fr-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1109/TUFFC.2007.411-
dc.identifier.isi000247578700025-
item.contributorKirsch, Philippe-
item.contributorAssouar, Mohamed B.-
item.contributorElmazria, O.-
item.contributorEl Hakiki, M.-
item.contributorMORTET, Vincent-
item.contributorAlnot, Patrick-
item.accessRightsClosed Access-
item.fullcitationKirsch, Philippe; Assouar, Mohamed B.; Elmazria, O.; El Hakiki, M.; MORTET, Vincent & Alnot, Patrick (2007) Combination of e-beam lithography and of high velocity AlN/diamond-layered structure for SAW filters in X band. In: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 54(7). p. 1486-1491.-
item.fulltextNo Fulltext-
item.validationecoom 2008-
crisitem.journal.issn0885-3010-
crisitem.journal.eissn1525-8955-
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