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http://hdl.handle.net/1942/4167
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DC Field | Value | Language |
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dc.contributor.author | Michaelson, Sh. | - |
dc.contributor.author | Ternyak, O. | - |
dc.contributor.author | Hoffman, A. | - |
dc.contributor.author | WILLIAMS, Oliver | - |
dc.contributor.author | Gruen, D. M. | - |
dc.date.accessioned | 2007-12-11T09:26:21Z | - |
dc.date.available | 2007-12-11T09:26:21Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, 91(10). p. 103104-... | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/1942/4167 | - |
dc.description.abstract | Hydrogenated nanodiamond films consisting of 300 and 10-30 nm grain sizes were examined by high resolution electron energy loss spectroscopy. C-H stretching modes were identified at 350, 360, and 375 meV. The mode at 375 meV was enhanced in the case of 10-30 nm grain size and it is stable up to in situ annealing to >>800 degrees C. Complete hydrogen desorption occurs upon annealing to 1000 degrees C. Exposure of the nanodiamond film to atomic hydrogen results in a strong quenching of the 375 meV C-H mode, most likely due to preferential etching of (sp(2))-carbon-hydrogen at the surface and grain boundaries of the films. | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Hydrogen bonding at grain surfaces and boundaries of nanodiamond films detected by high resolution electron energy loss spectroscopy | - |
dc.type | Journal Contribution | - |
dc.identifier.issue | 10 | - |
dc.identifier.spage | 103104 | - |
dc.identifier.volume | 91 | - |
local.format.pages | 3 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Technion Israel Inst Technol, Schulich Fac Chem, IL-32000 Haifa, Israel. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC, Div IMOMEC, B-3590 Diepenbeek, Belgium. Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA.Hoffman, A, Technion Israel Inst Technol, Schulich Fac Chem, IL-32000 Haifa, Israel.choffman@tx.technion.ac.il | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1063/1.2779848 | - |
dc.identifier.isi | 000249322900057 | - |
item.fulltext | No Fulltext | - |
item.contributor | Michaelson, Sh. | - |
item.contributor | Ternyak, O. | - |
item.contributor | Hoffman, A. | - |
item.contributor | WILLIAMS, Oliver | - |
item.contributor | Gruen, D. M. | - |
item.fullcitation | Michaelson, Sh.; Ternyak, O.; Hoffman, A.; WILLIAMS, Oliver & Gruen, D. M. (2007) Hydrogen bonding at grain surfaces and boundaries of nanodiamond films detected by high resolution electron energy loss spectroscopy. In: APPLIED PHYSICS LETTERS, 91(10). p. 103104-.... | - |
item.accessRights | Closed Access | - |
item.validation | ecoom 2008 | - |
crisitem.journal.issn | 0003-6951 | - |
crisitem.journal.eissn | 1077-3118 | - |
Appears in Collections: | Research publications |
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