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http://hdl.handle.net/1942/4171
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DC Field | Value | Language |
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dc.contributor.author | Volodin, A. | - |
dc.contributor.author | Toma, C. | - |
dc.contributor.author | BOGDAN, G. | - |
dc.contributor.author | DEFERME, Wim | - |
dc.contributor.author | HAENEN, Ken | - |
dc.contributor.author | NESLADEK, Milos | - |
dc.contributor.author | Van Haesendonck, C. | - |
dc.date.accessioned | 2007-12-11T09:37:23Z | - |
dc.date.available | 2007-12-11T09:37:23Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2915-2919 | - |
dc.identifier.issn | 0031-8965 | - |
dc.identifier.uri | http://hdl.handle.net/1942/4171 | - |
dc.description.abstract | Electrostatic force microscopy (EFM) has been used to probe the conducting properties of the hydrogen-terminated (H-terminated) surface of CVD diamond films. Two parallel electrodes, separated by a distance of 100 mu m, are fabricated on the sample surface. EFM images the voltage distribution over a current-carrying H-terminated diamond film. The almost linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as diffusive conductors with a well-defined value of the sheet resistance. On the other hand, conductive as well as insulating regions are observed to coexist for H-terminated diamond surfaces with poor electric conductivity. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. | - |
dc.language.iso | en | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.title | Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 2919 | - |
dc.identifier.issue | 9 | - |
dc.identifier.spage | 2915 | - |
dc.identifier.volume | 204 | - |
local.format.pages | 5 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, B-3001 Heverlee, Belgium. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. CEA Saclay, LIST, CEA Rech Technol, DETECS SSTM LTD, F-91191 Gif Sur Yvette, France.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, B-3001 Heverlee, Belgium.Alexander.Volodin@fys.kuleuven.be | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.isi | 000249648700013 | - |
dc.identifier.url | http://doi.wiley.com/10.1002/pssa.200776334 | - |
item.fulltext | No Fulltext | - |
item.fullcitation | Volodin, A.; Toma, C.; BOGDAN, G.; DEFERME, Wim; HAENEN, Ken; NESLADEK, Milos & Van Haesendonck, C. (2007) Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films. In: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2915-2919. | - |
item.accessRights | Closed Access | - |
item.validation | ecoom 2008 | - |
item.contributor | Volodin, A. | - |
item.contributor | Toma, C. | - |
item.contributor | BOGDAN, G. | - |
item.contributor | DEFERME, Wim | - |
item.contributor | HAENEN, Ken | - |
item.contributor | NESLADEK, Milos | - |
item.contributor | Van Haesendonck, C. | - |
crisitem.journal.issn | 0031-8965 | - |
crisitem.journal.eissn | 1862-6319 | - |
Appears in Collections: | Research publications |
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