Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4289
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dc.contributor.authorMEERT, Bart-
dc.contributor.authorQUAEYHAEGENS, Carl-
dc.contributor.authorKNUYT, Gilbert-
dc.contributor.authorJANSSEN, Herman-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-12-20T15:48:02Z-
dc.date.available2007-12-20T15:48:02Z-
dc.date.issued1998-
dc.identifier.citationProceedings of the 5th International Conference on Residual Stresses. p. 522-527.-
dc.identifier.urihttp://hdl.handle.net/1942/4289-
dc.publisher1997-
dc.titleNew approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffraction-
dc.typeProceedings Paper-
dc.identifier.epage527-
dc.identifier.spage522-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcat-
local.bibliographicCitation.btitleProceedings of the 5th International Conference on Residual Stresses-
item.contributorMEERT, Bart-
item.contributorQUAEYHAEGENS, Carl-
item.contributorKNUYT, Gilbert-
item.contributorJANSSEN, Herman-
item.contributorSTALS, Lambert-
item.fullcitationMEERT, Bart; QUAEYHAEGENS, Carl; KNUYT, Gilbert; JANSSEN, Herman & STALS, Lambert (1998) New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffraction. In: Proceedings of the 5th International Conference on Residual Stresses. p. 522-527..-
item.accessRightsClosed Access-
item.fulltextNo Fulltext-
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