Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/43031
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMelchor-Robles, J. A.-
dc.contributor.authorNieto-Zepeda, K. E.-
dc.contributor.authorVazquez-Barragan, N. E.-
dc.contributor.authorARREGUIN CAMPOS, Mariana-
dc.contributor.authorRodriguez-Rosales, K.-
dc.contributor.authorCruz-Gomez, J.-
dc.contributor.authorGuillen-Cervantes, A.-
dc.contributor.authorSantos-Cruz, J.-
dc.contributor.authorOlvera, M. de la L.-
dc.contributor.authorContreras-Puente, G.-
dc.contributor.authorMoure-Flores, F. de-
dc.date.accessioned2024-06-03T07:14:32Z-
dc.date.available2024-06-03T07:14:32Z-
dc.date.issued2024-
dc.date.submitted2024-06-03T06:17:47Z-
dc.identifier.citationCoatings, 14 (4) (Art N° 452)-
dc.identifier.urihttp://hdl.handle.net/1942/43031-
dc.description.abstractThe development of semitransparent CdS/CdTe ultrathin solar cells has been delayed as a result of the activation annealing to which the device must be subjected, which may involve problems such as the sublimation of ultrathin films and the diffusion of Cd and S at the interface. In this work, CdS/CdTe ultrathin devices on soda-lime glass/SnO2:F/ZnO substrates were obtained by RF magnetron sputtering. CdS/CdTe ultrathin heterostructures were obtained with the following thicknesses for the CdS thin film: 70, 110, and 135 nm. The CdTe thickness film was kept constant at 620 nm. Subsequently, activation annealing with CdCl2 was carried out at 400 degrees C. Surface characterization was performed by scanning electron microscopy, which indicated that the CdCl2 annealing tripled the CdTe thin films' grain size. Raman characterization showed that CdS thin films deposited by RF sputtering present the first, the second, and the third longitudinal optical modes, indicating the good crystallinity of the CdS thin films. The study showed that the photovoltaic properties of the CdS/CdTe ultrathin devices improved as the CdS thicknesses decreased.-
dc.description.sponsorshipFunding: The authors acknowledge partial financial support for this work from Universidad Autónoma de Querétaro and CONAHCYT. Acknowledgments: The authors acknowledge the technical support of Marcela Guerrero, A. Tavira Fuentes, and A. Garcia-Sotelo, from the CINVESTAV-IPN, and Arturo Velasco (from UAQ) for their technical support. The authors acknowledge partial financial support for this work from Universidad Autónoma de Querétaro and CONAHCYT.-
dc.language.isoen-
dc.publisherMDPI-
dc.rights2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/).-
dc.subject.otherphotovoltaic windows-
dc.subject.otherRF magnetron sputtering-
dc.subject.otherCdS/CdTe heterostructures-
dc.titleCharacterization of CdS/CdTe Ultrathin-Film Solar Cells with Different CdS Thin-Film Thicknesses Obtained by RF Sputtering-
dc.typeJournal Contribution-
dc.identifier.issue4-
dc.identifier.volume14-
local.format.pages11-
local.bibliographicCitation.jcatA1-
dc.description.notesNieto-Zepeda, KE; Moure-Flores, FD (corresponding author), Univ Autonoma Queretaro, Fac Quim, Energia Mat, Santiago De Queretaro 76010, Mexico.-
dc.description.notesjair.melchor@cinvestav.mx; karen_1704@hotmail.com; nevb92@gmail.com;-
dc.description.notesmariana.arrc@hotmail.com; karen.uaq@outlook.com; jorge_jcg@icloud.com;-
dc.description.notesangel@fis.cinvestav.mx; jsantos@uaq.edu.mx; molvera@cinvestav.mx;-
dc.description.notesgscp1953@gmail.com; fcomoure@hotmail.com-
local.publisher.placeST ALBAN-ANLAGE 66, CH-4052 BASEL, SWITZERLAND-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr452-
dc.identifier.doi10.3390/coatings14040452-
dc.identifier.isi001210519900001-
local.provider.typewosris-
local.description.affiliation[Melchor-Robles, J. A.] Ciudad Mex, Nanociencias & Nanotecnol, Ciudad De Mexico 07360, Mexico.-
local.description.affiliation[Nieto-Zepeda, K. E.; Vazquez-Barragan, N. E.; Rodriguez-Rosales, K.; Santos-Cruz, J.; Moure-Flores, F. de] Univ Autonoma Queretaro, Fac Quim, Energia Mat, Santiago De Queretaro 76010, Mexico.-
local.description.affiliation[Arreguin-Campos, M.] Hasselt Univ, Inst Mat Res IMO, Dept Chem, Adv Funct Polymers Grp, B-3500 Hasselt, Belgium.-
local.description.affiliation[Cruz-Gomez, J.; Contreras-Puente, G.] Inst Politecn Nacl, Escuela Super Fis & Matemat, Ciudad De Mexico 07738, Mexico.-
local.description.affiliation[Guillen-Cervantes, A.] Dept Fis, CINVESTAV IPN, Apdo Postal 14-740, Ciudad De Mexico 07360, Mexico.-
local.description.affiliation[Olvera, M. de la L.] Dept Ingn Electr, Secc Estado Solido, CINVESTAV IPN, Apdo Postal 14-740, Ciudad De Mexico 07360, Mexico.-
local.uhasselt.internationalyes-
item.contributorMelchor-Robles, J. A.-
item.contributorNieto-Zepeda, K. E.-
item.contributorVazquez-Barragan, N. E.-
item.contributorARREGUIN CAMPOS, Mariana-
item.contributorRodriguez-Rosales, K.-
item.contributorCruz-Gomez, J.-
item.contributorGuillen-Cervantes, A.-
item.contributorSantos-Cruz, J.-
item.contributorOlvera, M. de la L.-
item.contributorContreras-Puente, G.-
item.contributorMoure-Flores, F. de-
item.fulltextWith Fulltext-
item.accessRightsOpen Access-
item.fullcitationMelchor-Robles, J. A.; Nieto-Zepeda, K. E.; Vazquez-Barragan, N. E.; ARREGUIN CAMPOS, Mariana; Rodriguez-Rosales, K.; Cruz-Gomez, J.; Guillen-Cervantes, A.; Santos-Cruz, J.; Olvera, M. de la L.; Contreras-Puente, G. & Moure-Flores, F. de (2024) Characterization of CdS/CdTe Ultrathin-Film Solar Cells with Different CdS Thin-Film Thicknesses Obtained by RF Sputtering. In: Coatings, 14 (4) (Art N° 452).-
crisitem.journal.issn2079-6412-
crisitem.journal.eissn2079-6412-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
Characterization of CdS_CdTe Ultrathin-Film Solar Cells with Different CdS Thin-Film Thicknesses Obtained by RF Sputtering.pdfPublished version4.42 MBAdobe PDFView/Open
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.