Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/43398
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hamid, Sabarina Abdul | - |
dc.contributor.author | Zulkifli, Muhammad Nubli | - |
dc.contributor.author | Jalar, Azman | - |
dc.contributor.author | Jusoh, Wan Nursheila Wan | - |
dc.contributor.author | Abu Bakar, Maria | - |
dc.contributor.author | BASHER, Hassan | - |
dc.contributor.author | DAENEN, Michael | - |
dc.date.accessioned | 2024-07-18T08:18:12Z | - |
dc.date.available | 2024-07-18T08:18:12Z | - |
dc.date.issued | 2024 | - |
dc.date.submitted | 2024-07-18T05:41:00Z | - |
dc.identifier.citation | IEEE Transactions on Components Packaging and Manufacturing Technology, 14 (6) , p. 1123 -1133 | - |
dc.identifier.uri | http://hdl.handle.net/1942/43398 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject.other | Bonding | - |
dc.subject.other | Acoustics | - |
dc.subject.other | Deformation | - |
dc.subject.other | Morphology | - |
dc.subject.other | Surface morphology | - |
dc.subject.other | Solar panels | - |
dc.subject.other | Ultrasonic variables measurement | - |
dc.subject.other | Copper indium gallium (de) selenide (CIGS) | - |
dc.subject.other | deformation | - |
dc.subject.other | Mo back-contact layer | - |
dc.subject.other | ultrasonic Al bond | - |
dc.subject.other | ultrasonic bonding mechanisms | - |
dc.title | Ultrasonic Al Bond on Mo Back-Contact Layer of CIGS Solar Panel Characterization Using Infinite Focus Microscope (IFM) and Micro-Ohmmeter | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 1133 | - |
dc.identifier.issue | 6 | - |
dc.identifier.spage | 1123 | - |
dc.identifier.volume | 14 | - |
local.format.pages | 11 | - |
local.bibliographicCitation.jcat | A1 | - |
local.publisher.place | 445 HOES LANE, PISCATAWAY, NJ 08855-4141 | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.identifier.doi | 10.1109/TCPMT.2024.3393917 | - |
dc.identifier.isi | 001259646200013 | - |
local.provider.type | wosris | - |
local.uhasselt.international | yes | - |
item.fullcitation | Hamid, Sabarina Abdul; Zulkifli, Muhammad Nubli; Jalar, Azman; Jusoh, Wan Nursheila Wan; Abu Bakar, Maria; BASHER, Hassan & DAENEN, Michael (2024) Ultrasonic Al Bond on Mo Back-Contact Layer of CIGS Solar Panel Characterization Using Infinite Focus Microscope (IFM) and Micro-Ohmmeter. In: IEEE Transactions on Components Packaging and Manufacturing Technology, 14 (6) , p. 1123 -1133. | - |
item.accessRights | Closed Access | - |
item.fulltext | No Fulltext | - |
item.contributor | Hamid, Sabarina Abdul | - |
item.contributor | Zulkifli, Muhammad Nubli | - |
item.contributor | Jalar, Azman | - |
item.contributor | Jusoh, Wan Nursheila Wan | - |
item.contributor | Abu Bakar, Maria | - |
item.contributor | BASHER, Hassan | - |
item.contributor | DAENEN, Michael | - |
crisitem.journal.issn | 2156-3950 | - |
crisitem.journal.eissn | 2156-3985 | - |
Appears in Collections: | Research publications |
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