Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/43398
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dc.contributor.authorHamid, Sabarina Abdul-
dc.contributor.authorZulkifli, Muhammad Nubli-
dc.contributor.authorJalar, Azman-
dc.contributor.authorJusoh, Wan Nursheila Wan-
dc.contributor.authorAbu Bakar, Maria-
dc.contributor.authorBASHER, Hassan-
dc.contributor.authorDAENEN, Michael-
dc.date.accessioned2024-07-18T08:18:12Z-
dc.date.available2024-07-18T08:18:12Z-
dc.date.issued2024-
dc.date.submitted2024-07-18T05:41:00Z-
dc.identifier.citationIEEE Transactions on Components Packaging and Manufacturing Technology, 14 (6) , p. 1123 -1133-
dc.identifier.urihttp://hdl.handle.net/1942/43398-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subject.otherBonding-
dc.subject.otherAcoustics-
dc.subject.otherDeformation-
dc.subject.otherMorphology-
dc.subject.otherSurface morphology-
dc.subject.otherSolar panels-
dc.subject.otherUltrasonic variables measurement-
dc.subject.otherCopper indium gallium (de) selenide (CIGS)-
dc.subject.otherdeformation-
dc.subject.otherMo back-contact layer-
dc.subject.otherultrasonic Al bond-
dc.subject.otherultrasonic bonding mechanisms-
dc.titleUltrasonic Al Bond on Mo Back-Contact Layer of CIGS Solar Panel Characterization Using Infinite Focus Microscope (IFM) and Micro-Ohmmeter-
dc.typeJournal Contribution-
dc.identifier.epage1133-
dc.identifier.issue6-
dc.identifier.spage1123-
dc.identifier.volume14-
local.format.pages11-
local.bibliographicCitation.jcatA1-
local.publisher.place445 HOES LANE, PISCATAWAY, NJ 08855-4141-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1109/TCPMT.2024.3393917-
dc.identifier.isi001259646200013-
local.provider.typewosris-
local.uhasselt.internationalyes-
item.fullcitationHamid, Sabarina Abdul; Zulkifli, Muhammad Nubli; Jalar, Azman; Jusoh, Wan Nursheila Wan; Abu Bakar, Maria; BASHER, Hassan & DAENEN, Michael (2024) Ultrasonic Al Bond on Mo Back-Contact Layer of CIGS Solar Panel Characterization Using Infinite Focus Microscope (IFM) and Micro-Ohmmeter. In: IEEE Transactions on Components Packaging and Manufacturing Technology, 14 (6) , p. 1123 -1133.-
item.accessRightsClosed Access-
item.fulltextNo Fulltext-
item.contributorHamid, Sabarina Abdul-
item.contributorZulkifli, Muhammad Nubli-
item.contributorJalar, Azman-
item.contributorJusoh, Wan Nursheila Wan-
item.contributorAbu Bakar, Maria-
item.contributorBASHER, Hassan-
item.contributorDAENEN, Michael-
crisitem.journal.issn2156-3950-
crisitem.journal.eissn2156-3985-
Appears in Collections:Research publications
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