Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/45745Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Daenen, Michaël | - |
| dc.contributor.advisor | Vermang, Bart | - |
| dc.contributor.author | BREUGELMANS, Robbe | - |
| dc.date.accessioned | 2025-03-26T15:00:55Z | - |
| dc.date.available | 2025-03-26T15:00:55Z | - |
| dc.date.issued | 2025 | - |
| dc.date.submitted | 2025-03-26T13:21:28Z | - |
| dc.identifier.uri | http://hdl.handle.net/1942/45745 | - |
| dc.description.abstract | Not available | - |
| dc.language.iso | en | - |
| dc.title | Potential-Induced Degradation in Perovskite Devices: From Novel Stress Testing to Effective Avoidance | - |
| dc.type | Theses and Dissertations | - |
| local.format.pages | 158 | - |
| local.bibliographicCitation.jcat | T1 | - |
| local.type.refereed | Non-Refereed | - |
| local.type.specified | Phd thesis | - |
| local.provider.type | - | |
| local.uhasselt.international | no | - |
| item.contributor | BREUGELMANS, Robbe | - |
| item.fullcitation | BREUGELMANS, Robbe (2025) Potential-Induced Degradation in Perovskite Devices: From Novel Stress Testing to Effective Avoidance. | - |
| item.embargoEndDate | 2030-03-15 | - |
| item.fulltext | With Fulltext | - |
| item.accessRights | Embargoed Access | - |
| Appears in Collections: | Research publications | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| PhDThesis_RobbeBreugelmans.pdf Until 2030-03-15 | Published version | 66.69 MB | Adobe PDF | View/Open Request a copy |
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