Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4643
Full metadata record
DC FieldValueLanguage
dc.contributor.authorWU, Ting-Di-
dc.contributor.authorVLEKKEN, Johan-
dc.contributor.authorD'OLIESLAEGER, Marc-
dc.contributor.authorDE SCHEPPER, Luc-
dc.date.accessioned2007-12-20T15:51:19Z-
dc.date.available2007-12-20T15:51:19Z-
dc.date.issued1998-
dc.identifier.citationProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734.-
dc.identifier.urihttp://hdl.handle.net/1942/4643-
dc.publisherChichester Wiley 1998-
dc.titleAnalysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments-
dc.typeProceedings Paper-
dc.identifier.epage734-
dc.identifier.spage731-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcat-
local.bibliographicCitation.btitleProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997)-
item.accessRightsClosed Access-
item.fullcitationWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc & DE SCHEPPER, Luc (1998) Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734..-
item.contributorWU, Ting-Di-
item.contributorVLEKKEN, Johan-
item.contributorD'OLIESLAEGER, Marc-
item.contributorDE SCHEPPER, Luc-
item.fulltextNo Fulltext-
Appears in Collections:Research publications
Show simple item record

Page view(s)

50
checked on Nov 7, 2023

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.