Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4643
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dc.contributor.authorWU, Ting-Di-
dc.contributor.authorVLEKKEN, Johan-
dc.contributor.authorD'OLIESLAEGER, Marc-
dc.contributor.authorDE SCHEPPER, Luc-
dc.date.accessioned2007-12-20T15:51:19Z-
dc.date.available2007-12-20T15:51:19Z-
dc.date.issued1998-
dc.identifier.citationProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734.-
dc.identifier.urihttp://hdl.handle.net/1942/4643-
dc.publisherChichester Wiley 1998-
dc.titleAnalysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments-
dc.typeProceedings Paper-
dc.identifier.epage734-
dc.identifier.spage731-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcat-
local.bibliographicCitation.btitleProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997)-
item.accessRightsClosed Access-
item.contributorWU, Ting-Di-
item.contributorVLEKKEN, Johan-
item.contributorD'OLIESLAEGER, Marc-
item.contributorDE SCHEPPER, Luc-
item.fullcitationWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc & DE SCHEPPER, Luc (1998) Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734..-
item.fulltextNo Fulltext-
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