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http://hdl.handle.net/1942/4643
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DC Field | Value | Language |
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dc.contributor.author | WU, Ting-Di | - |
dc.contributor.author | VLEKKEN, Johan | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.date.accessioned | 2007-12-20T15:51:19Z | - |
dc.date.available | 2007-12-20T15:51:19Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734. | - |
dc.identifier.uri | http://hdl.handle.net/1942/4643 | - |
dc.publisher | Chichester Wiley 1998 | - |
dc.title | Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments | - |
dc.type | Proceedings Paper | - |
dc.identifier.epage | 734 | - |
dc.identifier.spage | 731 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997) | - |
item.fullcitation | WU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc & DE SCHEPPER, Luc (1998) Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 731-734.. | - |
item.fulltext | No Fulltext | - |
item.contributor | WU, Ting-Di | - |
item.contributor | VLEKKEN, Johan | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.contributor | DE SCHEPPER, Luc | - |
item.accessRights | Closed Access | - |
Appears in Collections: | Research publications |
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