Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/47760
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dc.contributor.authorPecunia, Vincenzo-
dc.contributor.authorAnthopoulos, Thomas D.-
dc.contributor.authorArmin, Ardalan-
dc.contributor.authorBouthinon, Benjamin-
dc.contributor.authorCaironi, Mario-
dc.contributor.authorCastellanos-Gomez, Andres-
dc.contributor.authorChen, Yongsheng-
dc.contributor.authorCho, Kilwon-
dc.contributor.authorClegg, Charlotte-
dc.contributor.authorFang, Xiaosheng-
dc.contributor.authorFendel, Peter-
dc.contributor.authorFowler , Boyd-
dc.contributor.authorGelinck, Gerwin-
dc.contributor.authorGottlob, Heinrich-
dc.contributor.authorGuyot-Sionnest, Philippe-
dc.contributor.authorHannebauer, Rob-
dc.contributor.authorHernandez-Sosa, Gerardo-
dc.contributor.authorHersam, Mark C.-
dc.contributor.authorHirsch, Lionel-
dc.contributor.authorHo, Johnny C.-
dc.contributor.authorIsikgor, Furkan H.-
dc.contributor.authorJoimel, Jerome-
dc.contributor.authorKim, Hyun Jae-
dc.contributor.authorKonstantatos, Gerasimos-
dc.contributor.authorLabram, John-
dc.contributor.authorLemme, Max C.-
dc.contributor.authorLeo, Karl-
dc.contributor.authorLhuillier, Emmanuel-
dc.contributor.authorLidorikis, Elefterios-
dc.contributor.authorLoi, Maria A.-
dc.contributor.authorMalinowski, Pawel E.-
dc.contributor.authorMerken, Patrick-
dc.contributor.authorMueller, Thomas-
dc.contributor.authorNasrollahi, Bahareh-
dc.contributor.authorNatali, Dario-
dc.contributor.authorNg, Tse Nga-
dc.contributor.authorNguyen , Thuc-Quyen-
dc.contributor.authorPark, Sung Kyu-
dc.contributor.authorPeng, Lian-Mao-
dc.contributor.authorSamori, Paolo-
dc.contributor.authorSargent, Edward H.-
dc.contributor.authorShen, Liang-
dc.contributor.authorShishido, Sanshiro-
dc.contributor.authorShorubalko, Ivan-
dc.contributor.authorSonar, Prashant-
dc.contributor.authorStranks, Samuel D.-
dc.contributor.authorTedde, Sandro F.-
dc.contributor.authorVANDEWAL, Koen-
dc.contributor.authorVerhaegen, Marc-
dc.contributor.authorWalia, Sumeet-
dc.contributor.authorYan, Feng-
dc.contributor.authorYokota, Tomoyuki-
dc.contributor.authorZhang, Fujun-
dc.date.accessioned2025-11-21T13:40:19Z-
dc.date.available2025-11-21T13:40:19Z-
dc.date.issued2025-
dc.date.submitted2025-11-20T15:06:36Z-
dc.identifier.citationNature photonics, 19 (11) , p. 1178 -1188-
dc.identifier.urihttp://hdl.handle.net/1942/47760-
dc.description.abstractPhotodetector technologies based on emerging semiconductors-for example, organic semiconductors, halide perovskites, quantum dots, low-dimensional semiconductors and metal oxides-hold considerable promise for next-generation optoelectronics. However, the breadth and multidisciplinarity of this field, alongside its diverse range of applications, have resulted in inconsistent performance characterization and reporting practices, hindering the effective benchmarking of these technologies. Here we present a consensus among researchers from academia and industry on accurately capturing the key performance metrics of photodetectors based on emerging semiconductors and utilizing the photoelectric effect. We analyse their underlying assumptions, discuss common misunderstandings, and provide guidelines for accurate characterization and reporting. Additionally, we discuss the benchmarking of these photodetector technologies with respect to diverse applications. We expect that these comprehensive guidelines for characterization, reporting and benchmarking will accelerate and streamline further advancements in the field, propelling emerging photodetector technologies towards their full potential.-
dc.description.sponsorshipV.P. acknowledges funding support from Simon Fraser University, the Natural Sciences and Engineering Research Council of Canada (NSERC) and the Canada Foundation for Innovation (CFI). T.D.A. acknowledges financial support from UK Research and Innovation (UKRI) and European Research Council (ERC), grant reference number EP/Z534006/1. A.C.-G. acknowledges funding from the Ministry of Science and Innovation (Spain) (PDC2023-145920-I00 and PID2023- 151946OB-I00). Y.C. acknowledges funding support from the National Key R&D Program of China (2022YFB4200400). C.C. acknowledges funding support from Mitacs. X.F. acknowledges funding support Bright (ANR-21-CE24-0012-02), DIRAC (ANR-24-ASM1-0001), camIR (ANR-24-CE42-2757) and Piquant (ANR-24-CE09-0786). E. Lidorikis acknowledges funding support from EU Horizon Project ‘AMBROSIA’ (number 101093166). M.A.L. acknowledges support from the European Research Council with the ERC Advanced Grant, DEOM (101055097). T.M. acknowledges support from the European Union (grant agreement number 785219 Graphene Flagship). B.N. acknowledges funding support from Simon Fraser University and the Natural Sciences and Engineering Research Council of Canada (NSERC). T.N.N. acknowledges support from USA National Science Foundation grants ECCS-2318990, CNS-2312715 and CNS-2408393. T.-Q.N. acknowledges support from the Mitsubishi Chemical Center for Advanced Materials at the University of California Santa Barbara and thanks H. M. Luong from Chulalongkorn University for suggestions and comments. P. Samorì acknowledges support from the Agence Nationale de la Recherche through the Interdisciplinary Thematic Institute SysChem via the IdEx Unistra (ANR-10-IDEX-0002) within the programme Investissement d’Avenir, and the Institut Universitaire de France (IUF). P. Sonar acknowledges support from the Australian Research Council grants DP210103006 & DP230101666. S.D.S. acknowledges the Royal Society and Tata Group (UF150033 and URF\R\221026). K.V. acknowledges support from the ERC (grant agreement number 864625). S.W. acknowledges funding support from the Australian Research Council through projects DP240100145, CE230100006 and the Office of National Intelligence Project NI230100026. T.Y. acknowledges support from JST ASPIRE for Rising Scientists (JPMJAP2336). F.Z. acknowledges funding support from the Natural Science Foundation of Beijing (4232073) and the National Natural Science Foundation of China (62175011). from the National Natural Science Foundation of China (number 52425308). G.H.-S. acknowledges support from the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) through grant number HE 7056/6-1 and Heisenberg-Professorship HE 7056/7-1. M.C.H. acknowledges support from the National Science Foundation (NSF) Assessing and Predicting Technology Outcomes (APTO) programme (grant number TF-2404035). L.H. acknowledges funding support from the Agence Nationale de la Recherche (DETECT project number ANR-23-CE24-0001) and the Region Nouvelle Aquitaine (OVERPRINT project number AAPR2024-2023-31782910). J.C.H. acknowledges support from a fellowship award by the Research Grants Council of the Hong Kong Special Administrative Region, China (CityURFS2021-1S04). H.J.K. acknowledges support from the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (number RS-2023-00256917). G.K. acknowledges support from the ERC under the European Union’s Horizon 2020 research and innovation programme (grant agreement number 101002306), the Fundació Privada Cellex, and the programme CERCA. J.L. acknowledges the University College London (UCL) Higher Education Innovation Fund KEI2024-01-34 HEIF for financial support. M.C.L. acknowledges support from the German Ministry of Education and Research (BMBF) through the project ATIQ (13N16116 and 13N16130). E. Lhuillier acknowledges support from the ERC grant AQDtive (grant number 101086358) and from French National Research Agency (ANR) through the grants-
dc.language.isoen-
dc.publisherNATURE PORTFOLIO-
dc.rightsOpen access-
dc.titleGuidelines for accurate evaluation of photodetectors based on emerging semiconductor technologies-
dc.typeJournal Contribution-
dc.identifier.epage1188-
dc.identifier.issue11-
dc.identifier.spage1178-
dc.identifier.volume19-
local.format.pages12-
local.bibliographicCitation.jcatA1-
dc.description.notesPecunia, V (corresponding author), Simon Fraser Univ, Sch Sustainable Energy Engn, Sustainable Optoelect Res Grp, Surrey, BC, Canada.; Anthopoulos, TD (corresponding author), Univ Manchester, Henry Royce Inst, Photon Sci Inst, Dept Elect & Elect Engn, Manchester, England.-
dc.description.notesvincenzo_pecunia@sfu.ca; thomas.anthopoulos@manchester.ac.uk-
local.publisher.placeHEIDELBERGER PLATZ 3, BERLIN, 14197, GERMANY-
local.type.refereedRefereed-
local.type.specifiedReview-
local.bibliographicCitation.statusEarly view-
local.type.programmeH2020-
local.relation.h2020101002306-
dc.identifier.doi10.1038/s41566-025-01759-1-
dc.identifier.isi001606242800001-
local.provider.typewosris-
local.description.affiliation[Pecunia, Vincenzo; Clegg, Charlotte; Nasrollahi, Bahareh] Simon Fraser Univ, Sch Sustainable Energy Engn, Sustainable Optoelect Res Grp, Surrey, BC, Canada.-
local.description.affiliation[Anthopoulos, Thomas D.] Univ Manchester, Henry Royce Inst, Photon Sci Inst, Dept Elect & Elect Engn, Manchester, England.-
local.description.affiliation[Armin, Ardalan] Swansea Univ, Ctr Integrat Semicond Mat CISM, Dept Phys, Bay Campus, Swansea, Wales.-
local.description.affiliation[Bouthinon, Benjamin; Joimel, Jerome] VS Technol, Grenoble, France.-
local.description.affiliation[Caironi, Mario; Natali, Dario] Ist Italiano Tecnol, Ctr Nano Sci & Technol, Milan, Italy.-
local.description.affiliation[Castellanos-Gomez, Andres] Inst Ciencia Mat Madrid ICMM CSIC, Foundry Res Grp 2D, Madrid, Spain.-
local.description.affiliation[Chen, Yongsheng] Nankai Univ, Coll Chem, Renewable Energy Convers & Storage Ctr RECAST, State Key Lab Elemento Organ Chem, Tianjin, Peoples R China.-
local.description.affiliation[Cho, Kilwon] Pohang Univ Sci & Technol POSTECH, Dept Chem Engn, Pohang, South Korea.-
local.description.affiliation[Fang, Xiaosheng] Fudan Univ, Coll Smart Mat & Future Energy, State Key Lab Mol Engn Polymers, Shanghai, Peoples R China.-
local.description.affiliation[Fendel, Peter] Thorlabs Inc, Newton, NJ USA.-
local.description.affiliation[Fowler, Boyd] OmniVis Technol Inc, Santa Clara, CA USA.-
local.description.affiliation[Gelinck, Gerwin] Eindhoven Univ Technol, Mol Mat & Nanosyst & Inst Complex Mol Syst, Eindhoven, Netherlands.-
local.description.affiliation[Gelinck, Gerwin] TNO, Holst Ctr, High Tech Campus 31, Eindhoven, Netherlands.-
local.description.affiliation[Gottlob, Heinrich] Vishay Semicond GmbH, Heilbronn, Germany.-
local.description.affiliation[Guyot-Sionnest, Philippe] Univ Chicago, James Franck Inst, Chicago, IL USA.-
local.description.affiliation[Hannebauer, Rob] Lumiense Photon Inc, Vancouver, BC, Canada.-
local.description.affiliation[Hernandez-Sosa, Gerardo] Karlsruhe Inst Technol, Light Technol Inst, Karlsruhe, Germany.-
local.description.affiliation[Hernandez-Sosa, Gerardo] Karlsruhe Inst Technol, Inst Microstruct Technol, Eggenstein Leopoldshafen, Germany.-
local.description.affiliation[Hernandez-Sosa, Gerardo] InnovationLab, Heidelberg, Germany.-
local.description.affiliation[Hersam, Mark C.] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL USA.-
local.description.affiliation[Hersam, Mark C.; Sargent, Edward H.] Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL USA.-
local.description.affiliation[Hersam, Mark C.; Sargent, Edward H.] Northwestern Univ, Dept Chem, Evanston, IL USA.-
local.description.affiliation[Hirsch, Lionel] Univ Bordeaux, CNRS, Bordeaux INP, Lab IMS, Talence, France.-
local.description.affiliation[Ho, Johnny C.] City Univ Hong Kong, Dept Mat Sci & Engn, Hong Kong, Peoples R China.-
local.description.affiliation[Isikgor, Furkan H.] Univ Manchester, Dept Chem, Manchester, England.-
local.description.affiliation[Kim, Hyun Jae] Yonsei Univ, Sch Elect & Elect Engn, Seoul, South Korea.-
local.description.affiliation[Konstantatos, Gerasimos] Barcelona Inst Sci & Technol, ICFO Inst Ciencies Foton, Castelldefels, Spain.-
local.description.affiliation[Konstantatos, Gerasimos] ICREA Inst Catalana Recerca & Estudiats Avancats, Barcelona, Spain.-
local.description.affiliation[Labram, John] UCL, Dept Elect & Elect Engn, London, England.-
local.description.affiliation[Lemme, Max C.] Rhein Westfal TH Aachen, Chair Elect Devices, Aachen, Germany.-
local.description.affiliation[Lemme, Max C.] AMO GmbH, Aachen, Germany.-
local.description.affiliation[Leo, Karl] Tech Univ Dresden, Dresden Integrated Ctr Appl Phys & Photon Mat IAPP, Dresden, Germany.-
local.description.affiliation[Leo, Karl] Tech Univ Dresden, Inst Appl Phys, Dresden, Germany.-
local.description.affiliation[Lhuillier, Emmanuel] Sorbonne Univ, Inst NanoSci Paris, CNRS, Paris, France.-
local.description.affiliation[Lidorikis, Elefterios] Univ Ioannina, Dept Mat Sci & Engn, Ioannina, Greece.-
local.description.affiliation[Loi, Maria A.] Univ Groningen, Zernike Inst Adv Mat, Photophys & Optoelect Grp, Groningen, Netherlands.-
local.description.affiliation[Malinowski, Pawel E.] IMEC VZW, Leuven, Belgium.-
local.description.affiliation[Merken, Patrick] Exosens, Leuven, Belgium.-
local.description.affiliation[Mueller, Thomas] Vienna Univ Technol, Inst Photon, Vienna, Austria.-
local.description.affiliation[Natali, Dario] Politecn Milan, Dept Elect Informat & Bioengn, Milan, Italy.-
local.description.affiliation[Ng, Tse Nga] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA USA.-
local.description.affiliation[Nguyen, Thuc-Quyen] Univ Calif Santa Barbara, Ctr Polymers & Organ Solids CPOS, Dept Chem & Biochem, Santa Barbara, CA USA.-
local.description.affiliation[Park, Sung Kyu] Chung Ang Univ, Dept Intelligent Semicond Engn, Seoul, South Korea.-
local.description.affiliation[Peng, Lian-Mao] Peking Univ, Ctr Carbon Based Elect, Sch Elect, Beijing, Peoples R China.-
local.description.affiliation[Samori, Paolo] Univ Strasbourg, CNRS, ISIS, Strasbourg, France.-
local.description.affiliation[Sargent, Edward H.] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON, Canada.-
local.description.affiliation[Shen, Liang] Jilin Univ, Coll Elect Sci & Engn, Int Ctr Future Sci, State Key Lab Integrated Optoelect, Changchun, Peoples R China.-
local.description.affiliation[Shishido, Sanshiro] Panason Holdings Corp, Green Transformat Div, Moriguchi, Japan.-
local.description.affiliation[Shorubalko, Ivan] Swiss Fed Labs Mat Sci & Technol Empa, Transport Nanoscale Interfaces Lab, Dubendorf, Switzerland.-
local.description.affiliation[Sonar, Prashant] Queensland Univ Technol QUT, Fac Sci Sch Chem & Phys, Brisbane, Qld, Australia.-
local.description.affiliation[Sonar, Prashant] Queensland Univ Technol QUT, Ctr Mat Sci, Brisbane, Qld, Australia.-
local.description.affiliation[Stranks, Samuel D.] Univ Cambridge, Dept Chem Engn & Biotechnol, Cambridge, England.-
local.description.affiliation[Tedde, Sandro F.] Innovat Ctr Erlangen, Siemens Healthineers AG, Technol Excellence, Erlangen, Germany.-
local.description.affiliation[Vandewal, Koen] Hasselt Univ, Inst Mat Res Imo Imomec, Hasselt, Belgium.-
local.description.affiliation[Vandewal, Koen] Imec, Imo Imomec, Diepenbeek, Belgium.-
local.description.affiliation[Verhaegen, Marc] Photon Etc, Montreal, PQ, Canada.-
local.description.affiliation[Walia, Sumeet] RMIT Univ, Ctr Optoelect Mat & Sensors, Sch Engn, Melbourne, Vic, Australia.-
local.description.affiliation[Yan, Feng] Hong Kong Polytech Univ, Res Ctr Organ Elect, Dept Appl Phys, ,Kowloon, Hong Kong, Peoples R China.-
local.description.affiliation[Yokota, Tomoyuki] Univ Tokyo, Grad Sch Engn, Dept Elect Engn & Informat Syst, Tokyo, Japan.-
local.description.affiliation[Zhang, Fujun] Beijing Jiaotong Univ, Sch Phys Sci & Engn, Beijing, Peoples R China.-
local.uhasselt.internationalyes-
item.fullcitationPecunia, Vincenzo; Anthopoulos, Thomas D.; Armin, Ardalan; Bouthinon, Benjamin; Caironi, Mario; Castellanos-Gomez, Andres; Chen, Yongsheng; Cho, Kilwon; Clegg, Charlotte; Fang, Xiaosheng; Fendel, Peter; Fowler , Boyd; Gelinck, Gerwin; Gottlob, Heinrich; Guyot-Sionnest, Philippe; Hannebauer, Rob; Hernandez-Sosa, Gerardo; Hersam, Mark C.; Hirsch, Lionel; Ho, Johnny C.; Isikgor, Furkan H.; Joimel, Jerome; Kim, Hyun Jae; Konstantatos, Gerasimos; Labram, John; Lemme, Max C.; Leo, Karl; Lhuillier, Emmanuel; Lidorikis, Elefterios; Loi, Maria A.; Malinowski, Pawel E.; Merken, Patrick; Mueller, Thomas; Nasrollahi, Bahareh; Natali, Dario; Ng, Tse Nga; Nguyen , Thuc-Quyen; Park, Sung Kyu; Peng, Lian-Mao; Samori, Paolo; Sargent, Edward H.; Shen, Liang; Shishido, Sanshiro; Shorubalko, Ivan; Sonar, Prashant; Stranks, Samuel D.; Tedde, Sandro F.; VANDEWAL, Koen; Verhaegen, Marc; Walia, Sumeet; Yan, Feng; Yokota, Tomoyuki & Zhang, Fujun (2025) Guidelines for accurate evaluation of photodetectors based on emerging semiconductor technologies. In: Nature photonics, 19 (11) , p. 1178 -1188.-
item.contributorPecunia, Vincenzo-
item.contributorAnthopoulos, Thomas D.-
item.contributorArmin, Ardalan-
item.contributorBouthinon, Benjamin-
item.contributorCaironi, Mario-
item.contributorCastellanos-Gomez, Andres-
item.contributorChen, Yongsheng-
item.contributorCho, Kilwon-
item.contributorClegg, Charlotte-
item.contributorFang, Xiaosheng-
item.contributorFendel, Peter-
item.contributorFowler , Boyd-
item.contributorGelinck, Gerwin-
item.contributorGottlob, Heinrich-
item.contributorGuyot-Sionnest, Philippe-
item.contributorHannebauer, Rob-
item.contributorHernandez-Sosa, Gerardo-
item.contributorHersam, Mark C.-
item.contributorHirsch, Lionel-
item.contributorHo, Johnny C.-
item.contributorIsikgor, Furkan H.-
item.contributorJoimel, Jerome-
item.contributorKim, Hyun Jae-
item.contributorKonstantatos, Gerasimos-
item.contributorLabram, John-
item.contributorLemme, Max C.-
item.contributorLeo, Karl-
item.contributorLhuillier, Emmanuel-
item.contributorLidorikis, Elefterios-
item.contributorLoi, Maria A.-
item.contributorMalinowski, Pawel E.-
item.contributorMerken, Patrick-
item.contributorMueller, Thomas-
item.contributorNasrollahi, Bahareh-
item.contributorNatali, Dario-
item.contributorNg, Tse Nga-
item.contributorNguyen , Thuc-Quyen-
item.contributorPark, Sung Kyu-
item.contributorPeng, Lian-Mao-
item.contributorSamori, Paolo-
item.contributorSargent, Edward H.-
item.contributorShen, Liang-
item.contributorShishido, Sanshiro-
item.contributorShorubalko, Ivan-
item.contributorSonar, Prashant-
item.contributorStranks, Samuel D.-
item.contributorTedde, Sandro F.-
item.contributorVANDEWAL, Koen-
item.contributorVerhaegen, Marc-
item.contributorWalia, Sumeet-
item.contributorYan, Feng-
item.contributorYokota, Tomoyuki-
item.contributorZhang, Fujun-
item.fulltextWith Fulltext-
item.accessRightsOpen Access-
crisitem.journal.issn1749-4885-
crisitem.journal.eissn1749-4893-
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